X-ray and electrical characterization of a multipixel diamond-based detector in high temperature environments

被引：0

作者：

Serpente, V. ^{[1
]}

Mastellone, M. ^{[1
]}

Girolami, M. ^{[1
]}

Bellucci, A. ^{[1
]}

Ranieri, A. ^{[2
]}

Boothby, A. ^{[3
]}

Walsh, S. ^{[3
]}

Lefeuvre, G. ^{[3
]}

Trucchi, D. M. ^{[1
]}

机构：

[1] CNR, Ist Struttura Mat ISM, DiaTHEMA Lab, Via Salaria Km 29-300, I-00015 Monterotondo, Rome, Italy

[2] CNR, Ist Cristallog IC, Via Salaria Km 29-300, I-00015 Monterotondo, Rome, Italy

[3] Micron Semicond Ltd, Lancing Business Pk, Lancing BN15 8SJ, W Sussex, England

来源：

关键词：

Single-crystal diamond; X-ray detection; Thermal characterization; Electrical characterization;

D O I：

10.1016/j.diamond.2023.109819

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An 8-pixel X-ray diamond detector prototype, fabricated on an alumina substrate and specifically designed to operate at high temperature, has been developed and tested. Tungsten electrodes were developed as metal -semiconductor contact and showed an ohmic behavior, as inferred from current-voltage measurements. A 40 -cy-cles thermal stress test performed in helium atmosphere, in which temperature has been varied cyclically be-tween 100 and 240 degrees C, showed minor evolution of the detector dark current, presumably related to progressive water desorption from the alumina substrate. Conversely, X-ray photocurrent measurements showed no signif-icant differences before and after the thermal cycles, confirming no degradation of the stability of the prototype even after prolonged operation at high temperature.

引用

页数：6

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