Physical properties of Mg doped ZnS thin films via spray pyrolysis

被引:1
|
作者
Ali, R. S. [1 ]
Rasheed, H. S. [2 ]
Abdulameer, N. D. [3 ]
Habubi, N. F. [4 ]
Chiad, S. S. [2 ]
机构
[1] Mustansiriyah Univ, Coll Sci, Dept Phys, Baghdad, Iraq
[2] Mustansiriyah Univ, Coll Educ, Dept Phys, Baghdad, Iraq
[3] Al Mustaqbal Univ Coll, Dept Opt Tech, Babylon, Iraq
[4] Alnukhba Univ Coll, Dept Engn Refrigerat & Air Conditioning Technol, Baghdad, Iraq
来源
CHALCOGENIDE LETTERS | 2023年 / 20卷 / 03期
关键词
ZnS thin films; Mg; XRD; AFM; OPTICAL-PROPERTIES; ELECTRICAL-PROPERTIES; NANOSTRUCTURES; GROWTH;
D O I
10.15251/CL.2023.203.187
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Chemical spray pyrolysis (CSP) was utilized to create pure Zinc Sulfide (ZnS) and magnesium (Mg) doped thin films on a clean glass substrate at a temperature equal to 400 degrees C. X-ray diffraction test revealed a cubic wurtzite crystal structure with average crystallite sizes of 10.99 and 12.27 nm for ZnS and ZnS: Mg, respectively. XRD analysis of the doped films revealed a polycrystalline structure with a predominant peak along the (220) plane and additional peaks along the (111), (200), and (222) planes. The grain size raised from 10.99 to 12.27 nm as a result of the XRD patterns. The increase in Mg content from 0% to 3%, affect the bandgap that fell from 3.52 to 3.42 eV. As the Mg content increased, the transmittance and refractive index of the films was lowered.
引用
收藏
页码:187 / 196
页数:10
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