High-energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk dysprosium

被引:1
|
作者
Zborowski, C. [1 ,2 ]
Vanleenhove, A. [1 ]
Hoflijk, I. [1 ]
Vaesen, I. [1 ]
Artyushkova, K. [3 ]
Conard, T. [1 ]
机构
[1] MCACSA, Imec, Kapeldreef 75, B-3001 Leuven, Belgium
[2] Katholieke Univ Leuven, Inst Kern Stralingsfys, Celestijnenlaan 200D, B-3001 Leuven, Belgium
[3] Phys Elect, 18725 Lake Dr East, Chanhassen, MN 55317 USA
来源
SURFACE SCIENCE SPECTRA | 2023年 / 30卷 / 02期
关键词
Dysprosium; HAXPES; Cr K-& alpha;
D O I
10.1116/6.0002813
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Dysprosium was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of dysprosium obtained using monochromatic Cr K-a radiation at 5414.8 eV include survey scan and high-resolution spectra of Dy 3s, Dy 3p(3/2), Dy 3d(5/2), Dy 4s, Dy 4p(3/2), Dy 4d, and Dy 5p.
引用
收藏
页数:8
相关论文
共 50 条
  • [21] Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determination
    Kobata, Masaaki
    Pis, Igor
    Nohira, Hiroshi
    Iwai, Hideo
    Kobayashi, Keisuke
    SURFACE AND INTERFACE ANALYSIS, 2011, 43 (13) : 1632 - 1635
  • [22] (111)CDTE SURFACE-STRUCTURE - A STUDY BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION, X-RAY PHOTOELECTRON-SPECTROSCOPY, AND X-RAY PHOTOELECTRON DIFFRACTION
    DUSZAK, R
    TATARENKO, S
    CIBERT, J
    SAMINADAYAR, K
    DESHAYES, C
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (06): : 3025 - 3030
  • [23] High-Energy X-ray Absorption Spectroscopy in Materials Chemistry
    Ghigna, Paolo
    Spinolo, Giorgio
    SCIENCE OF ADVANCED MATERIALS, 2015, 7 (10) : 2216 - 2233
  • [24] FLUX MEASUREMENT FOR X-RAY PHOTOELECTRON-SPECTROSCOPY
    WIELICZKA, DM
    WAGNER, E
    WINTERGERST, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (08): : 4387 - 4388
  • [25] X-RAY PHOTOELECTRON-SPECTROSCOPY WITH X-RAY PHOTONS OF HIGHER ENERGY
    WAGNER, CD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 518 - 523
  • [26] EPITAXIAL FILM CRYSTALLOGRAPHY BY HIGH-ENERGY AUGER AND X-RAY PHOTOELECTRON DIFFRACTION
    CHAMBERS, SA
    ADVANCES IN PHYSICS, 1991, 40 (04) : 357 - 415
  • [27] Study of KTiOPO4 surface by x-ray photoelectron spectroscopy and reflection high-energy electron diffraction
    Atuchin, VV
    Kesler, VG
    Maklakova, NY
    Pokrovsky, LD
    Semenenko, VN
    SURFACE AND INTERFACE ANALYSIS, 2002, 34 (01) : 320 - 323
  • [28] Binding energy referencing in X-ray photoelectron spectroscopy
    Greczynski, Grzegorz
    Hultman, Lars
    NATURE REVIEWS MATERIALS, 2025, 10 (01): : 62 - 78
  • [29] Study of poly(ether sulfone) metal interfaces by high energy x-ray photoelectron spectroscopy and x-ray absorption spectroscopy
    Tegen, N
    Morton, SA
    Watts, JF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (03): : 544 - 549
  • [30] X-RAY PHOTOELECTRON SPECTROSCOPY
    HOLLANDER, JM
    JOLLY, WL
    ACCOUNTS OF CHEMICAL RESEARCH, 1970, 3 (06) : 193 - +