Overestimating the Performance of Photon Ultraviolet Detectors

被引：11
|
作者：
Rogalski, A. [1 ]
机构：
[1] Mil Univ Technol, Inst Appl Phys, PL-00908 Warsaw, Poland
来源：
IEEE ELECTRON DEVICE LETTERS | 2023年 / 44卷 / 05期
关键词：
Signal fluctuation limit; BLIP limit; ultraviolet photodetectors; photogating effect; SOLAR-BLIND PHOTODETECTORS; RECORD-HIGH RESPONSIVITY; PHOTOTRANSISTOR; GAIN; DETECTIVITY; PHOTODIODE;
D O I：
10.1109/LED.2023.3262000
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Over the past few years, the available literature shows signaled great progress in improving the performance of ultraviolet detectors, even exceeding the physical limit of detection determined by signal fluctuations. This is particularly true for Ga2O3 phototransistors and a new generation of photodetectors with active areas containing low-dimensional solids. The purpose of this letter is to show cases of overestimation of the performance of ultraviolet detectors noted by the author and to draw attention to their fundamental physical limitations which are overlooked in the characterization of detectors.
引用
收藏
页码：805 / 808
页数：4
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