Probing the Formation of Dark Interlayer Excitons via Ultrafast Photocurrent

被引:2
|
作者
Yagodkin, Denis [1 ]
Kumar, Abhijeet [1 ]
Ankerhold, Elias [1 ]
Richter, Johanna [1 ]
Watanabe, Kenji [2 ]
Taniguchi, Takashi [3 ]
Gahl, Cornelius [1 ]
Bolotin, Kirill I. [1 ]
机构
[1] Free Univ Berlin, Dept Phys, D-14195 Berlin, Germany
[2] Natl Inst Mat Sci, Res Ctr Funct Mat, Tsukuba 3050044, Japan
[3] Natl Inst Mat Sci, Int Ctr Mat Nanoarchitecton, Tsukuba 3050044, Japan
关键词
interlayer dark exciton; transition metal dichalcogenides(TMDs); 2D semiconductor heterostructures; time-resolvedphotocurrent; interlayer dark exciton dynamics; time-resolved differential reflectivity; PHOTOEXCITED CARRIERS; DYNAMICS; RECOMBINATION;
D O I
10.1021/acs.nanolett.3c01708
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Optically dark excitons determine a wide range of properties of photoexcited semiconductors yet are hard to access via conventional time-resolved spectroscopies. Here, we develop a time-resolved ultrafast photocurrent technique (trPC) to probe the formation dynamics of optically dark excitons. The nonlinear nature of the trPC makes it particularly sensitive to the formation of excitons occurring at the femtosecond time scale after the excitation. As a proof of principle, we extract the interlayer exciton formation time of 0.4 ps at 160 mu J/cm(2) fluence in a MoS2/MoSe2 heterostructure and show that this time decreases with fluence. In addition, our approach provides access to the dynamics of carriers and their interlayer transport. Overall, our work establishes trPC as a technique to study dark excitons in various systems that are hard to probe by other approaches.
引用
收藏
页码:9212 / 9218
页数:7
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