HAXPES reference spectra of CeO2 with Cr Kα excitation (vol 31, 014004, 2024)

被引：0
|
作者：
Zheng, Dong [1 ]
Young, Christopher N. [2 ]
Stickle, William F. [2 ]
机构：
[1] HP Singapore Private Ltd, Adv Mat & Test Ctr, 138 Depot Rd, Singapore 109683, Singapore
[2] HP Inc, Analyt & Dev Labs, Corvallis, OR 97330 USA
来源：
SURFACE SCIENCE SPECTRA | 2024年 / 31卷 / 01期
关键词：
Auger; CeO[!sub]2[!/sub; ceria; cerium oxide; Cr K[!sub]α[!/sub; HAXPES;
D O I：
10.1116/6.0003720
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Hard x-ray photoelectron spectroscopy (HAXPES) using monochromatic Cr K-alpha radiation (5414.8 eV) has been used to acquire XPS and Auger data on an argon gas cluster-sputtered CeO2 sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
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页数：3
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