Integration of a superconducting nanowire single-photon detector into a confocal microscope for time-resolved photoluminescence (TRPL)-mapping: Sensitivity and time resolution

被引:3
|
作者
Buschmann, Volker [1 ]
Ermilov, Eugeny [1 ]
Koberling, Felix [1 ]
Loidolt-Krueger, Maria [1 ]
Breitlow, Jürgen [1 ]
Kooiman, Hugo [2 ]
Los, Johannes W. N. [2 ]
van Willigen, Jan [2 ]
Caldarola, Martin [2 ]
Fognini, Andreas [2 ]
Castaneda, Mario U. [2 ]
de Wild, Jessica [3 ,4 ,5 ]
Vermang, Bart [3 ,4 ,5 ]
Brammertz, Guy [3 ,4 ,5 ]
Erdmann, Rainer [1 ]
机构
[1] PicoQuant GmbH, Rudower Chaussee 29, D-12489 Berlin, Germany
[2] Single Quantum, Rotterdamseweg 394, NL-2629 HH Delft, Netherlands
[3] Hasselt Univ, Imo Imomec, Martelarenlaan 42, B-3500 Hasselt, Belgium
[4] Imec, Imo Imomec, Thor Pk 8320, B-3600 Genk, Belgium
[5] Imo Imomec, EnergyVille, Thor Pk 8320, B-3600 Genk, Belgium
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2023年 / 94卷 / 03期
关键词
DETECTION EFFICIENCY; STATE;
D O I
10.1063/5.0134451
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This report highlights the combination of the MicroTime 100 upright confocal fluorescence lifetime microscope with a Single Quantum Eos Superconducting Nanowire Single-Photon Detector (SNSPD) system as a powerful tool for photophysical research and applications. We focus on an application in materials science, photoluminescence imaging, and lifetime characterization of Cu(InGa)Se-2 (CIGS) devices intended for solar cells. We demonstrate improved sensitivity, signal-to-noise ratio, and time-resolution in combination with confocal spatial resolution in the near-infrared (NIR) range, specifically in the 1000-1300 nm range. The MicroTime 100-Single Quantum Eos system shows two orders of magnitude higher signal-to-noise ratio for CIGS devices' photoluminescence imaging compared to a standard NIR-photomultiplier tube (NIR-PMT) and a three-fold improvement in time resolution, which is now limited by the laser pulse width. Our results demonstrate the advantages in terms of image quality and time resolution of SNSPDs technology for imaging in materials science.(c) 2023 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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页数:7
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