Analytical Models for Grain Size Determination of Metallic Coatings and Machined Surface Layers Using the Four-Point Probe Method

被引:0
|
作者
Mehner, Thomas [1 ]
Lampke, Thomas [1 ]
机构
[1] Tech Univ Chemnitz, Inst Mat Sci & Engn, Mat & Surface Engn, Erfenschlager Str 73, D-09125 Chemnitz, Germany
关键词
electrical resistance; electrical resistivity; electrical conductivity; grain size; analytical model; four-point probe method; surface layer; ELECTRICAL-CONDUCTIVITY; RESISTIVITY; CU;
D O I
10.3390/ma16176000
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The grain size of a metallic coating or the surface layer after the machining of metallic parts strongly impacts corrosion and wear properties along with fatigue behavior. By measuring the combined electrical resistance of this layer and the substrate using the four-point probe method, the grain size of the layer can be determined. For different grain shapes, models are derived based on an analytical approach. The parameters in the models can be determined by appropriate calibration measurements. As a result, the grain sizes can be determined quickly with a non-destructive method, which can be applied to ensure consistent coating or machining results as part of quality control routines in industrial processes.
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页数:15
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