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- [3] Characterization of semiconductor surface conductivity by using microscopic four-point probe technique 18TH INTERNATIONAL VACUUM CONGRESS (IVC-18), 2012, 32 : 347 - 355
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- [8] Development of a Thickness Meter for Conductive Thin Films Using Four-Point Probe Method Journal of Electrical Engineering & Technology, 2021, 16 : 2265 - 2273