Poisson's ratio determination of Au nanofilms by piezoresistive measurements

被引:1
|
作者
Oliva, A. I. [1 ]
Comparan-Rodriguez, G. G. [1 ]
Sosa, V. [1 ]
Oliva-Aviles, A. I. [2 ]
机构
[1] Ctr Invest & Estudios Avanzados, IPN Unidad Merida, Dept Fis Aplicada, Km 6 Antigua Carretera Progreso,AP 73-Cordemex, Merida 97310, Yucatan, Mexico
[2] Univ Anahuac Mayab, Div Ingn & Ciencias Exactas, Carretera Merida Progreso Km 15-5,AP 96-Cordemex, Merida 97310, Yucatan, Mexico
关键词
THIN-FILMS; TEMPERATURE-COEFFICIENT; ELECTRICAL-RESISTIVITY; YOUNGS MODULUS; RESISTANCE; CONDUCTIVITY;
D O I
10.1007/s10853-023-08536-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A methodology for determining the Poisson's ratio (nu) of Au films with nanometric thicknesses is proposed. Au films with thicknesses of 10, 20, and 40 nm were thermally evaporated onto polyimide substrates (Kapton (R) 300HN) and electrodes were attached for the electrical measurements. The thermal coefficient of resistance of the Au films was estimated at the first stage of heating, caused by Joule effect, where electrical resistance and temperature followed a linear dependence. When thermal stabilization of the Au/polyimide system was reached, it was subjected to axial strain within an elastic regime and the electrical resistance of the metallic film was continuously recorded. The gage factor (piezoresistive sensitivity) of the Au nanofilms was measured and used for the estimation of the Poisson's ratio according to its definition for metallic materials. A value of nu = 0.50 was estimated for the Au thin films, being slightly higher than the Au bulk value (nu(bulk) = 0.42).
引用
收藏
页码:8563 / 8571
页数:9
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