Electrodes as the protagonists in composite barrier Ferroelectric Tunnel Junctions

被引:2
|
作者
Ipsita, Sushree [1 ]
Sahu, Sunil Ku [1 ]
Mahapatra, P. K. [1 ]
机构
[1] Siksha O Anusandhan Univ, Dept Phys, Bhubaneswar 751030, Orissa, India
关键词
tunneling electro-resistance ratio; charge distribution; potential energy profile; tunneling current density; accumulation region; transmission probability; MEMORY; ELECTRORESISTANCE; THICKNESS;
D O I
10.1088/1402-4896/acf806
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The role of electrodes in composite barrier Ferroelectric Tunnel Junctions (FTJs) is investigated for the systems (//Pt/STO/BTO/SRO, //Pt/STO/BTO/Pt, //SRO/STO/BTO/SRO and // SRO/STO/ BTO/Pt). The tunneling current is controlled by the potential drop in the accumulation and depletion region in the electrodes which depends on the ratio of their screening length to permittivity (delta/epsilon). The Tunneling electro resistance ratio (TER) becomes significant for bias potential V > |P| (delta(1)/ epsilon(1) +t(d)/ epsilon(d) + delta(2) /epsilon(2))wherein the screening charge density sigma(s) remains negative causing the pull-down of the barrier towards the Fermi level and an increase in the tunneling current. Among the studied systems //Pt/20 angstrom STO/24 angstrom BTO/SRO system with an active device length of 7.6 nmis found to have a current density of 3.38x10(4) A cm(-2) and 0.22 A cm(-2) in the ON and OFF state and an absolute TER of around 1.52x10(5)% at the bias of 0.77 Vconform to the necessary conditions of efficient application in memory devices.
引用
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页数:16
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