Quantum Conductance in Vertical Hexagonal Boron Nitride Memristors with Graphene-Edge Contacts

被引:11
|
作者
Xie, Jing [1 ]
Patoary, Md Naim [1 ]
Rahman Laskar, Md Ashiqur [1 ]
Ignacio, Nicholas D. [2 ]
Zhan, Xun [2 ]
Celano, Umberto [1 ]
Akinwande, Deji [2 ,3 ]
Esqueda, Ivan Sanchez [1 ]
机构
[1] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85281 USA
[2] Univ Texas Austin, Texas Mat Inst, Austin, TX 78712 USA
[3] Univ Texas Austin, Chandra Dept Elect & Comp Engn, Austin, TX 78712 USA
基金
美国国家科学基金会;
关键词
2D materials; graphene; hexagonal boron nitride; memristor; RRAM; nonvolatile memory; INTEGRATION; DEVICES;
D O I
10.1021/acs.nanolett.3c04057
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Two-dimensional materials (2DMs) have gained significant interest for resistive-switching memory toward neuromorphic and in-memory computing (IMC). To achieve atomic-level miniaturization, we introduce vertical hexagonal boron nitride (h-BN) memristors with graphene edge contacts. In addition to enabling three-dimensional (3D) integration (i.e., vertical stacking) for ultimate scalability, the proposed structure delivers ultralow power by isolating single conductive nanofilaments (CNFs) in ultrasmall active areas with negligible leakage thanks to atomically thin (similar to 0.3 nm) graphene edge contacts. Moreover, it facilitates studying fundamental resistive-switching behavior of single CNFs in CVD-grown 2DMs that was previously unattainable with planar devices. This way, we studied their programming characteristics and observed a consistent single quantum step in conductance attributed to unique atomically constrained nanofilament behavior in CVD-grown 2DMs. This resistive-switching property was previously suggested for h-BN memristors and linked to potential improvements in stability (robustness of CNFs), and now we show experimental evidence including superior retention of quantized conductance.
引用
收藏
页码:2473 / 2480
页数:8
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