Transport properties and electronic phase transitions in two-dimensional tellurium at high pressure

Utilizing in situ Raman spectroscopy, resistivity, and Hall-effect measurements, we conducted an extensive investigation on the continuous electronic phase transitions and transport properties of two-dimensional (2D) tellurium (Te) under high pressure at room and low temperature (80-300 K). The distinguishable decrease in the A1 Raman mode's full width at half maximum in the trigonal phase (Te-I) indicated an electronic phase transition at 2.2 GPa. The following Hall-effect experiments located the Lifshitz transition and the semiconductor-semimetal transition at 0.9 and 1.9 GPa, respectively, and the semiconductor-semimetal transition was also confirmed by resistivity variation through temperature. The charge carrier types of the Te changed from hole to electron during the phase transition from Te-I to Te-II (triclinic phase) at low temperature, while the transport parameters remained almost unchanged during the phase transition from Te-II to Te-III (monoclinic phase). The results offered complete and thorough electronic phase transitions and transport characteristics of 2D Te, hence great advancing the potential application of Te in electronic devices.