Design and analysis of normally-off GaN-HEMT using β-Ga2O3 buffer for low-loss power converter applications

被引:4
|
作者
Revathy, A. [1 ]
Kumar, J. Vijaya [1 ]
Murugapandiyan, P. [2 ]
Wasim, Mohd [3 ]
Devi, K. Nirmala [4 ]
Ramkumar, N. [2 ]
机构
[1] Anil Neerukonda Inst Technol & Sci, Dept Elect & Elect Engn, Visakhapatnam 531162, India
[2] Anil Neerukonda Inst Technol & Sci, Dept Elect & Commun Engn, Visakhapatnam 531162, India
[3] Lovely Profess Univ, Div Res & Dev, Phagwara 144001, Punjab, India
[4] Saveetha Engn Coll, Dept Elect & Commun Engn, Chennai 602105, India
来源
MICRO AND NANOSTRUCTURES | 2023年 / 182卷
关键词
HEMT; Switching applications; Normally-off mode; Switching delay; Breakdown voltage; ALGAN/GAN MIS-HEMTS; SI SUBSTRATE; V-TH; ENHANCEMENT; PERFORMANCE;
D O I
10.1016/j.micrna.2023.207643
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
An enhancement mode HETM with beta-Ga2O3 buffer is proposed, and its electrical characteristics are analyzed using the physics-based numerical simulator ATLAS TCAD. HEMT with p-GaN/AlGaN/GaN/beta-Ga2O3 utilized for normally-off mode operation of HEMT. The proposed beta-Ga2O3 buffer based HEMT in this work reveals low on-resistance (R-on), high drain current density (I-DS,I- max), high transconductance (g(m,max)), excellent breakdown voltage (VBR) and low gate switching delay. The ultra-wide bandgap beta-Ga2O3 (E-G similar to 4.7 eV) buffer on silicon carbide (SiC) substrate HEMT mitigates the interface-related traps due to nearly lattice match with GaN and suppressing buffer leakage current by serving as a natural back-barrier. This beta-Ga2O3 back-barrier structure increases the 2DEG (two-dimensional electron gas) and mitigates buffer leakage currents. Numerical simulation shows I-DS,I-max of 0.95 A/mm, R-on of 4.26 Omega mm, and V-BR of 835 V. for L-G = 0.8 mu m HEMT. The excellent device characteristics indicate the merits of beta-Ga2O3 buffer-based normally-off HEMT for medium voltage range (<800 V) low resistive loss power converters applications.
引用
收藏
页数:11
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