Machine Learning Automated Analysis of Enormous Synchrotron X-ray Diffraction Datasets

被引:5
|
作者
Zhao, Xiaodong [1 ,2 ]
Luo, YiXuan [3 ]
Liu, Juejing [1 ,4 ]
Liu, Wenjun [5 ]
Rosso, Kevin M. [1 ]
Guo, Xiaofeng [2 ,4 ]
Geng, Tong [3 ]
Li, Ang [1 ]
Zhang, Xin [1 ]
机构
[1] Pacific Northwest Natl Lab, Richland, WA 99354 USA
[2] Washington State Univ, Dept Chem, Pullman, WA 99164 USA
[3] Univ Rochester, Dept Elect & Comp Engn, New York, NY 14627 USA
[4] Washington State Univ, Mat Sci & Engn Program, Pullman, WA 99164 USA
[5] Argonne Natl Lab, Adv Photon Source, Lemont, IL 60439 USA
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2023年 / 127卷 / 30期
基金
美国国家科学基金会;
关键词
IDENTIFICATION;
D O I
10.1021/acs.jpcc.3c03572
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
X-raydiffraction (XRD) data analysis can be a time-consumingandlaborious task. Deep neural network (DNN) based models trained withsynthetic XRD patterns have been proven to be a highly efficient,accurate, and automated method for analyzing common XRD data collectedfrom solid samples in ambient environments. However, it remains unclearwhether synthetic XRD-based models can be effective in solving micro(& mu;)-XRDmapping data for in situ experiments involving liquid phases, whichalways have lower quality and significant artifacts. In this study,we collected & mu;-XRD mapping data from a LaCl3-calcitehydrothermal fluid system and trained two categories of models toanalyze the experimental XRD patterns. The models trained solely withsynthetic XRD patterns showed low accuracy (as low as 64%) when solvingexperimental & mu;-XRD mapping data. However, the accuracy of theDNN models significantly improved (90% or above) when we trained themwith a data set containing both synthetic and a small number of labeledexperimental & mu;-XRD patterns. This study highlights the importanceof labeled experimental patterns in training DNN models to solve & mu;-XRDmapping data from in situ experiments involving liquid phases.
引用
收藏
页码:14830 / 14838
页数:9
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