Outage probability of multiple-IRS-assisted SISO wireless communications over Rician fading

被引：5
|
作者：
Hindustani, R. K. [1 ]
Dixit, Dharmendra [2 ]
Sharma, Sanjeev [1 ]
Bhatia, Vimal [3 ]
机构：
[1] Indian Inst Technol BHU Varanasi, Dept Elect Engn, Varanasi, India
[2] Rajkiya Engn Coll, Dept Elect Engn, Sonbhadra, Uttar Pradesh, India
[3] Indian Inst Technol Indore, Discipline Elect Engn, Indore, India
来源：
PHYSICAL COMMUNICATION | 2023年 / 59卷
关键词：
Intelligent reflecting surface; Outage probability; Rician fading channel; Diversity order; Coding gain; Single-input-single-output; RECONFIGURABLE INTELLIGENT SURFACES; PERFORMANCE ANALYSIS; SYSTEMS; DESIGN;
D O I：
10.1016/j.phycom.2023.102102
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Outage probability (OP) performance of multiple-intelligent reflecting surface (IRS)-assisted is pre-sented for a practically important single-input-single-output (SISO) wireless communication system over Rician fading channels where the IRS panel selection is considered. We investigate the SISO wireless communication scenario in which a single antenna transmitting node is sending its message to the receiving node with the aid of the best IRS panel selection. This wireless communication scenario model is a typical application of the uplink scenarios for future cellular wireless systems. We derive approximate OP expressions in the closed form using both the central limit theorem and the Laguerre series expansion. Further, we also derive a simple asymptotic OP to get diversity order and coding gain. The influence of each system parameter on OP performance is thoroughly investigated. In addition, the analytical OP results are corroborated with simulated OP results to confirm the accuracy of our presented analytical results. & COPY; 2023 Elsevier B.V. All rights reserved.
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收藏
页数：8
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