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- [41] Performance Recovery of p-GaN Etch-Induced Degradation via Atomic Layer Deposition In Situ N2 Plasma and Postanneal-Assisted Passivation PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2025, 19 (01):
- [43] Enhanced hot-hole induced degradation of strained p-channel metal oxide semiconductor transistors in complementary metal oxide semiconductor technology with 2.0 nm gate oxide JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (08): : 5953 - 5958