A combined electrochemical impedance spectroscopy (EIS) and X-ray photoelectron spectroscopy (XPS) approach showed that the corrosion behaviour of 5083 Al alloy was controlled by Mg dissolution at the Mg-rich intermetallic coarse particles (IMCs) that were defects of the passive film. It was thus shown that microstructures with high amount of Mg-rich IMCs were less resistant to corrosion. EIS experimental data were well superimposed with fitted ones calculated using a model proposed in the literature for pure magnesium. The model allowed to plot the resistivity profiles of the passive films, which highlighted their double-layer structure evidenced by XPS.
机构:
Fed Inst Mat Res & Testing, BAM, Surface & Thin Film Anal, D-12200 Berlin, GermanyFed Inst Mat Res & Testing, BAM, Surface & Thin Film Anal, D-12200 Berlin, Germany
Retzko, I
Unger, WES
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机构:
Fed Inst Mat Res & Testing, BAM, Surface & Thin Film Anal, D-12200 Berlin, GermanyFed Inst Mat Res & Testing, BAM, Surface & Thin Film Anal, D-12200 Berlin, Germany
机构:
Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, WAPhysical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, WA