Combined electrochemical impedance spectroscopy and X-ray photoelectron spectroscopy analysis of the passive films formed on 5083 aluminium alloy

被引:22
|
作者
Nkoua, C. [1 ]
Esvan, J. [1 ]
Tribollet, B. [2 ]
Basseguy, R. [3 ]
Blanc, C. [1 ]
机构
[1] Univ Toulouse, CIRIMAT, CNRS, INP ENSIACET, 4 Allee Emile Monso, F-31030 Toulouse 4, France
[2] Sorbonne Univ, LISE UMR 8235, CNRS, 4 Pl Jussieu BP 133, F-75252 Paris, France
[3] Univ Toulouse, LGC, CNRS, INP,UPS, 4 Allee Emile Monso,CS 44362, F-31030 Toulouse 4, France
关键词
A; intermetallics; B; XPS; C; passive films; aluminium; magnesium; EIS; AL-MG ALLOYS; STRESS-CORROSION CRACKING; MEASUREMENT MODELS; RESISTIVITY DISTRIBUTIONS; LOCALIZED CORROSION; INITIAL OXIDATION; BEHAVIOR; AA5083; MECHANISM; MAGNESIUM;
D O I
10.1016/j.corsci.2023.111337
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A combined electrochemical impedance spectroscopy (EIS) and X-ray photoelectron spectroscopy (XPS) approach showed that the corrosion behaviour of 5083 Al alloy was controlled by Mg dissolution at the Mg-rich intermetallic coarse particles (IMCs) that were defects of the passive film. It was thus shown that microstructures with high amount of Mg-rich IMCs were less resistant to corrosion. EIS experimental data were well superimposed with fitted ones calculated using a model proposed in the literature for pure magnesium. The model allowed to plot the resistivity profiles of the passive films, which highlighted their double-layer structure evidenced by XPS.
引用
收藏
页数:12
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