A Combined Raman Spectroscopy and Atomic Force Microscopy System for In Situ and Real-Time Measures in Electrochemical Cells

被引：4

作者：

Bussetti, Gianlorenzo ^{[1
]}

Menegazzo, Marco ^{[1
]}

Mitko, Sergei ^{[2
]}

Castiglioni, Chiara ^{[3
]}

Tommasini, Matteo ^{[3
]}

Lucotti, Andrea ^{[3
]}

Magagnin, Luca ^{[3
]}

Russo, Valeria ^{[4
]}

Li Bassi, Andrea ^{[4
]}

Siena, Martina ^{[5
]}

Guadagnini, Alberto ^{[5
]}

Grillo, Samuele ^{[6
]}

Del Curto, Davide ^{[7
]}

Duo, Lamberto ^{[1
]}

机构：

[1] Politecn Milan, Dept Phys, I-20133 Milan, Italy

[2] NT MDT BV, Hoenderpk Weg 96 B, NL-7335 GX Apeldoorn, Netherlands

[3] Politecn Milan, Dept Chem Mat & Chem Engn, I-20133 Milan, Italy

[4] Politecn Milan, Dept Energy, I-20133 Milan, Italy

[5] Politecn Milan, Dept Civil & Environm Engn, I-20133 Milan, Italy

[6] Politecn Milan, Dept Elect Informat & Bioengn, I-20133 Milan, Italy

[7] Politecn Milan, Dept Architecture & Urban Studies, I-20133 Milan, Italy

来源：

MATERIALS | 2023年 / 16卷 / 06期

关键词：

solid-liquid interface; HOPG intercalation; in situ AFM; Raman spectroscopy; INTERCALATION COMPOUNDS; GRAPHITE-INTERCALATION; TUNNELING-MICROSCOPY; ANION INTERCALATION; GRAPHENE;

D O I：

10.3390/ma16062239

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

An innovative and versatile set-up for in situ and real time measures in an electrochemical cell is described. An original coupling between micro-Raman spectroscopy and atomic force microscopy enables one to collect data on opaque electrodes. This system allows for the correlation of topographic images with chemical maps during the charge exchange occurring in oxidation/reduction processes. The proposed set-up plays a crucial role when reactions, both reversible and non-reversible, are studied step by step during electrochemical reactions and/or when local chemical analysis is required.

引用

页数：10

共 50 条

[1] Best Practices for Real-Time in Situ Atomic Force and Chemical Force Microscopy of Crystals
Poloni, Laura N.
Zhong, Xiaodi
Ward, Michael D.
Mandal, Trinanjana
CHEMISTRY OF MATERIALS, 2017, 29 (01) : 331 - 345
[2] Real-time and in-situ atomic force microscopy to quantify polymer biodegradation
Latuga, BM
Arceo, JF
Rowe, S
Baron, SF
Dennis, DE
Augustine, BH
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 225 : U513 - U513
[3] Real-Time In Situ Atomic Force Microscopy Imaging of Bismuth Crystal Growth
Dale, Sara E. C.
Bending, Simon J.
Peter, Laurence M.
LANGMUIR, 2009, 25 (19) : 11228 - 11231
[4] Sensing the onset of epoxy coating degradation with combined Raman spectroscopy/atomic force microscopy/electrochemical impedance spectroscopy
Szocinski, M.
Darowicki, K.
PROGRESS IN ORGANIC COATINGS, 2023, 174
[5] IN-SITU AND REAL-TIME MONITORING OF THE INSE SURFACE BY ATOMIC-FORCE MICROSCOPY WITH ATOMIC-RESOLUTION DURING ELECTROCHEMICAL REACTIONS
UOSAKI, K
KOINUMA, M
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1993, 357 (1-2): : 301 - 306
[6] The dissolution of hectorite: In-situ, real-time observations using atomic force microscopy
Bosbach, D
Charlet, L
Bickmore, B
Hochella, MF
AMERICAN MINERALOGIST, 2000, 85 (09) : 1209 - 1216
[7] Real-time atomic force microscopy in lubrication condition
Lee, Hyunsoo
Lee, Donghyeok
Kim, K. B.
Seo, Yongho
Kim, Hyunsook
Lee, Haiwon
ULTRAMICROSCOPY, 2010, 110 (07) : 826 - 830
[8] Electrochemical processes of nucleation and growth of hydroxyapatite on titanium supported by real-time electrochemical atomic force microscopy
Eliaz, Noam
Eliyahu, Moshe
JOURNAL OF BIOMEDICAL MATERIALS RESEARCH PART A, 2007, 80A (03) : 621 - 634
[9] Real-time detection of probe loss in atomic force microscopy
De, Tathagata
Agarwal, Pranav
Sahoo, Deepak R.
Salapaka, Murti V.
APPLIED PHYSICS LETTERS, 2006, 89 (13)
[10] Array atomic force microscopy for real-time multiparametric analysis
Yang, Qingqing
Ma, Qian
Herum, Kate M.
Wang, Chonghe
Patel, Nirav
Lee, Joon
Wang, Shanshan
Yen, Tony M.
Wang, Jun
Tang, Hanmei
Lo, Yu-Hwa
Head, Brian P.
Azam, Farooq
Xu, Sheng
Cauwenberghs, Gert
McCulloch, Andrew D.
John, Scott
Liu, Zhaowei
Lal, Ratnesh
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2019, 116 (13) : 5872 - 5877

← 1 2 3 4 5 →