共 50 条
- [43] INSITU SPECTROSCOPIC ELLIPSOMETRIC INVESTIGATION OF ARGON ION-BOMBARDMENT OF SINGLE-CRYSTAL SILICON AND SILICON DIOXIDE FILMS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 76 - 79
- [45] Structurization of submonolayer carbon coatings deposited in a low-pressure microwave plasma on single-crystal silicon Semiconductors, 2011, 45 : 1483 - 1488
- [48] Microscopic and spectroscopic investigation of phase evolution within static and dynamic indentations in single-crystal silicon MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2016, 673 : 321 - 331
- [50] Modeling and experiment of material removal rate for cutting single-crystal silicon by electrical discharge wire sawing INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2024, 133 (9-10): : 4605 - 4616