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- [22] Extracting the young's modulus and stress gradient of thin films from the pull-in voltage of a micro curled cantilever beam 2007 2ND IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3, 2007, : 1185 - 1188
- [23] Young's modulus measurement of thin films for electronic devices by precision 3-points bending method Nihon Kikai Gakkai Ronbunshu A, 773 (190-200):
- [29] Examination of bulge test for determining residual stress, Young's modulus, and Poisson's ratio of 3C-SiC thin films Mehregany, M. (mxm31@cwru.edu), 1600, American Society of Civil Engineers (16):