Design and Test of a New Dielectric-Loaded Resonator for the Accurate Characterization of Conductive and Dielectric Materials

被引:2
|
作者
Alimenti, Andrea [1 ]
Torokhtii, Kostiantyn [1 ]
Garcia, Pablo Vidal [1 ]
Pompeo, Nicola [1 ,2 ]
Silva, Enrico [1 ,2 ]
机构
[1] Roma Tre Univ, Dept Ind Elect & Mech Engn, Via Vito Volterra 62, I-00146 Rome, Italy
[2] Ist Nazl Fis Nucl INFN, Sez Roma Tre, Via Vasca Navale 84, I-00146 Rome, Italy
关键词
dielectric-loaded resonator; surface resistance measurement; complex permittivity measurement; microwave material characterization; 3D printing materials; SURFACE-RESISTANCE MEASUREMENTS; COMPLEX PERMITTIVITY; MICROWAVE; ROUGHNESS; REFLECTION; FREQUENCY; COPPER; FILMS;
D O I
10.3390/s23010518
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The spread of additive manufacturing techniques in the prototyping and realization of high-frequency applications renewed the interest in the characterization of the electromagnetic properties of both dielectric and conductive materials, as well as the design of new versatile measurement techniques. In this framework, a new configuration of a dielectric-loaded resonator is presented. Its optimization, realization, and use are presented. A measurement repeatability of about one order of magnitude lower than the commonly found values (10-3 on the Q-factor and 15x10-6 on the resonance frequency, given in terms of the relative standard deviations of repeated measurements) was reached thanks to the design of a closed resonator in which the samples can be loaded without disassembling the whole measurement fixture. The uncertainty levels, the ease of use, and the versatility of the realized system make its use of potential interest in numerous scenarios.
引用
收藏
页数:19
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