Measuring Thermal Diffusivity of Azoheteroarene Thin Layers by Photothermal Beam Deflection and Photothermal Lens Methods

被引:4
|
作者
Mikaeeli, Ameneh [1 ,2 ]
Korte, Dorota [3 ]
Cabrera, Humberto [4 ]
Chomicki, Dariusz [1 ]
Dziczek, Dariusz [1 ]
Kharchenko, Oksana [5 ,6 ]
Song, Peng [7 ,8 ]
Liu, Junyan [7 ,8 ]
Wieck, Andreas D. [2 ]
Pawlak, Michal [1 ]
机构
[1] Nicolaus Copernicus Univ Torun, Inst Phys, Fac Phys Astron & Informat, Grudziadzka 5, PL-87100 Torun, Poland
[2] Ruhr Univ Bochum, Fak Phys & Astron, Chair Appl Solid State Phys, Univ Str 150, D-44780 Bochum, Germany
[3] Univ Nova Gorica, Lab Enviromental Res, Vipavska 13, Nova Gorica SI-5000, Slovenia
[4] Abdus Salam Int Ctr Theoret Phys, STI Unit, MLab, Str Costiera 11, I-34151 Trieste, Italy
[5] Taras Shevchenko Natl Univ Kyiv, Fac Chem, 64-13 Volodymyrska St, UA-01601 Kiev, Ukraine
[6] Univ Angers, MiNt Lab, 4 Rue Larrey, F-49100 Angers, France
[7] Harbin Inst Technol, Sch Instrumentat Sci & Engn, Harbin 150001, Peoples R China
[8] Harbin Inst Technol, State Key Lab Robot & Syst, Harbin 150001, Peoples R China
关键词
thin films; photothermal spectroscopy; thermal transport; thermal wave; thermal conductivity; thermal diffusivity; ABSORPTION; LASERS;
D O I
10.3390/ma16186312
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Measurement of thermal properties of thin films is challenging. In particular, thermal characterization is very difficult in semi-transparent samples. Here, we use two photothermal methods to obtain information about the thermal diffusivity as well as thermal conductivity of azoheteroarene functionalized polymer thin layers. The photothermal beam deflection (PBD) method is employed to gather data directly on thermal conductivity and thermal diffusivity, while the thermal lens (TL) method is employed to measure the effective thermal diffusivity. Consequently, the thermal diffusivity of the layers is indirectly estimated from the effective thermal diffusivity using a well-established theoretical relationship. Despite the utilization of distinct methods, our study reveals a remarkable consistency in the highly accurate results obtained from both approaches. This remarkable agreement reaffirms the reliability and mutual compatibility of the employed methods, highlighting their shared ability to provide accurate and congruent outcomes.
引用
收藏
页数:10
相关论文
共 50 条
  • [31] Self-normalized photothermal technique for accurate thermal diffusivity measurements in thin metal layers
    Balderas-López, JA
    Mandelis, A
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (12): : 5219 - 5225
  • [32] Investigation of Thermal Properties of thin Semiconductor Layers Deposited on a Glass Substrate by the Photothermal Deflection Technique
    Gaied, Imen
    Ben Rabeh, Mohamed
    Rabhi, Adel
    Kanzari, Mounir
    Yacoubi, Noureddine
    DIFFUSION IN SOLIDS AND LIQUIDS V, PTS 1 AND 2, 2010, 297-301 : 537 - +
  • [33] PHOTOTHERMAL MEASUREMENT OF THERMAL-DIFFUSIVITY WITH AN INCOHERENT PUMP BEAM
    FIGARI, A
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1991, 2 (07) : 653 - 656
  • [34] TEST MEASUREMENTS OF THE PHOTOTHERMAL DEFLECTION METHOD TO DETERMINE THE THERMAL-DIFFUSIVITY OF SOLIDS
    SUBER, G
    BERTOLOTTI, M
    SIBILIA, C
    FERRARI, A
    APPLIED OPTICS, 1988, 27 (09): : 1807 - 1810
  • [35] DETERMINATION OF THERMAL-DIFFUSIVITY OF A SOLID-SURFACE BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY
    SUBER, G
    BERTOLOTTI, M
    FERRARI, A
    SIBILIA, C
    RICCIARDIELLO, F
    MATERIALS CHEMISTRY AND PHYSICS, 1987, 18 (03) : 277 - 286
  • [36] TRANSVERSE PHOTOTHERMAL DEFLECTION SPECTROSCOPY (PDS) APPLIED TO THERMAL-DIFFUSIVITY MEASUREMENTS
    SUBER, G
    BERTOLOTTI, M
    SIBILIA, C
    FERRARI, A
    RICCIARDIELLO, FG
    JOURNAL OF THERMAL ANALYSIS, 1987, 32 (04): : 1039 - 1050
  • [37] Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique
    Chen, X
    Zhu, JT
    Yin, G
    Zhao, L
    MATERIALS LETTERS, 2006, 60 (01) : 63 - 66
  • [38] Thermal diffusivity of lead-free solders measured by photothermal beam deflection.: Effect of the surrounding media
    Prior, P
    Gören, A
    Macedo, F
    Ferreira, JA
    Soares, D
    JOURNAL DE PHYSIQUE IV, 2005, 125 : 265 - 268
  • [39] PHOTOTHERMAL DEFLECTION METHOD APPLIED TO THE DETERMINATION OF THERMAL-DIFFUSIVITY OF CERAMIC MATERIALS
    BERTOLOTTI, M
    FABBRI, L
    SIBILIA, C
    SUBER, G
    FERRARI, A
    QUANTUM ELECTRONICS AND PLASMA PHYSICS: 5TH ITALIAN CONFERENCE, 1989, 21 : 265 - 269
  • [40] Through-Plane and In-Plane Thermal Diffusivity Determination of Graphene Nanoplatelets by Photothermal Beam Deflection Spectrometry
    Cabrera, Humberto
    Korte, Dorota
    Budasheva, Hanna
    Abbasgholi N. Asbaghi, Behnaz
    Bellucci, Stefano
    MATERIALS, 2021, 14 (23)