Microstructure and Shear properties of Sn-xZn Transient Liquid Phase Bonding in 3D-Chip Stacking Packaging

被引:2
|
作者
Liu, Zheng [1 ]
Wang, Xiang Yu [3 ]
Yang, Li [1 ,2 ]
Sun, Lian Bei [4 ]
Jiao, Xi Xuan [5 ]
Gao, Hui Ming [6 ]
Zhang, Zhi Tao [6 ]
Zhang, Yao Cheng [7 ]
机构
[1] Guilin Univ Aerosp Technol, Sch Mech Engn, Guilin 541004, Guangxi, Peoples R China
[2] Guangdong Univ Technol, Sch Adv Mfg, Guangzhou 510006, Guangdong, Peoples R China
[3] Guilin Univ Elect Technol, Sch Mech Engn, Guilin 514004, Guangxi, Peoples R China
[4] Changzhou Univ, Sch Mech Engn, Changzhou 213164, Jiangsu, Peoples R China
[5] Guilin Univ Technol, Sch Mech Engn, Guilin 541004, Guangxi, Peoples R China
[6] Natl Dies & Molds Qual Supervis Test Ctr, Xuzhou 215300, Jiangsu, Peoples R China
[7] Changshu Inst Technol, Sch Automat Engn, Suzhou 215500, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
Composite solder; Transient liquid phase connection; Microstructure; Shear properties;
D O I
10.1007/s12666-022-02866-1
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
The microstructure and shear property of Cu/Sn-xZn/Cu (x = 0, 2, 5, 9, 30, 70 wt.%) composite solder joints fabricated by transient liquid phase (TLP) bonding were investigated. The results showed that the appropriate amount of Zn particles inhibited Cu-6(Sn, Zn)(5) phase formation at the Cu/solder interface. The Zn particles can improve the interface IMC morphology of composite solder joints, the interface IMC thickness of Cu/Sn-30Zn/Cu solder joint is only 3.89 mu m, and the excessive (30-70 wt.%) Zn particles are harmful to the composite solder joints. Doping 2-9 wt.% Zn particles can improve the shear strength. The maximum shear strength value of the Cu/Sn-9Zn/Cu composite solder joint reaches 14.18 MPa. The fracture mechanism is mainly ductile brittle mixed fracture, which occurs near the Interface reaction zone.
引用
收藏
页码:2757 / 2763
页数:7
相关论文
共 50 条
  • [21] Study on Microstructure and Shear Property of Cu/In-xCu/Cu Transient Liquid Phase Bonding Joints
    Zheng Liu
    Li Yang
    Yu Hang Xu
    Yao Cheng Zhang
    Kai Jian Lu
    Feng Xu
    Hui Ming Gao
    Journal of Electronic Materials, 2021, 50 : 217 - 223
  • [22] 21-Layer 3-D Chip Stacking Based on Cu-Sn Bump Bonding
    Li, Cao
    Wang, Xuefang
    Song, Shao
    Liu, Sheng
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2015, 5 (05): : 627 - 635
  • [23] Microstructure and mechanical properties of Cu/Sn-In/Cu joints obtained by ultrasonic-assisted transient liquid phase bonding in air
    Bi, Yan
    Nie, Yong
    Wang, Qian
    Han, Jian
    Cai, Yangchuan
    ADVANCES IN MECHANICAL ENGINEERING, 2020, 12 (10)
  • [24] Effect of powders on microstructures and mechanical properties for Sn–Ag transient liquid phase bonding in air
    Yudian Bao
    Aiping Wu
    Huakai Shao
    Yue Zhao
    Guisheng Zou
    Journal of Materials Science: Materials in Electronics, 2018, 29 : 10246 - 10257
  • [25] Effect of bonding temperature on the microstructure, IMCs growth, and shear property of Cu/Sn-9Zn-30Cu/Cu solder joint by transient liquid phase bonding
    Zheng, Yang
    Liu, Zheng
    Wu, Haodong
    He, Yucong
    Yang, Li
    Zhang, Yaocheng
    INTERMETALLICS, 2025, 181
  • [26] Microstructure evolution and mechanical reliability of Cu/Au–Sn/Cu joints during transient liquid phase bonding
    J. Peng
    H. S. Liu
    H. B. Ma
    X. M. Shi
    R. C. Wang
    Journal of Materials Science, 2018, 53 : 9287 - 9296
  • [27] Transient liquid phase bonding of dissimilar nickel base superalloys - wettability, microstructure and mechanical properties
    Aluru, R.
    Gale, W. F.
    Chitti, S. V.
    Sofyan, N.
    Love, R. D.
    Fergus, J. W.
    MATERIALS SCIENCE AND TECHNOLOGY, 2008, 24 (05) : 517 - 528
  • [28] Low temperature transient liquid phase bonding of Au/Sn and Cu/Sn electroplated material systems for MEMS wafer-level packaging
    Marauska, S.
    Claus, M.
    Lisec, T.
    Wagner, B.
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2013, 19 (08): : 1119 - 1130
  • [29] Low temperature transient liquid phase bonding of Au/Sn and Cu/Sn electroplated material systems for MEMS wafer-level packaging
    S. Marauska
    M. Claus
    T. Lisec
    B. Wagner
    Microsystem Technologies, 2013, 19 : 1119 - 1130
  • [30] TRANSIENT LIQUID PHASE BEHAVIOR OF Sn-COATED Cu PARTICLES AND CHIP BONDING USING PASTE CONTAINING THE PARTICLES
    Hwang, Jun Ho
    Lee, Jong-Hyun
    ARCHIVES OF METALLURGY AND MATERIALS, 2017, 62 (02) : 1143 - 1148