analytic reliability solution;
dependent competing failure processes;
one-step parameter estimation;
variation of degradation rate;
Wiener degradation process;
SYSTEMS SUBJECT;
WEAR;
D O I:
10.1002/qre.3216
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Most systems experience both random shocks (hard failure) and performance degradation (soft failure) during service span, and the dependence of the two competing failure processes has become a key issue. In this study, a novel dependent competing failure processes (DCFPs) model with a varying degradation rate is proposed. The comprehensive impact of random shocks, especially the effect of cumulative shock, is reasonably considered. Specifically, a shock will cause an abrupt degradation damage, and when the cumulative shock reaches a predefined threshold, the degradation rate will change. An analytical reliability solution is derived under the concept of first hitting time (FHT). Besides, a one-step maximum likelihood estimation method is established by constructing a comprehensive likelihood function. Finally, the reasonability of the closed form reliability solution and the feasibility and effectiveness of the proposed DCFPs modeling methodology are demonstrated by a comparative simulation study.
机构:
Beihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R ChinaBeihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R China
Huang, Tingting
Zhao, Yuepu
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机构:
Beihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R ChinaBeihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R China
Zhao, Yuepu
Coit, David W.
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机构:
Rutgers State Univ, Dept Ind & Syst Engn, Piscataway, NJ 08854 USA
Tsinghua Univ, Dept Ind Engn, Beijing, Peoples R ChinaBeihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R China
Coit, David W.
Tang, Loon-Ching
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机构:
Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore, SingaporeBeihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R China