Reliability modeling for competing failure processes considering degradation rate variation under cumulative shock

被引:6
|
作者
Wang, Zhihua [1 ]
Cao, Shihao [1 ]
Li, Wenbo [2 ]
Liu, Chengrui [2 ]
Mu, Jingjing [3 ]
机构
[1] Beihang Univ, Sch Aeronaut Sci & Engn, Beijing 100191, Peoples R China
[2] Beijing Inst Control Engn, Beijing 100094, Peoples R China
[3] China Aerosp Sci & Technol Corp, Beijing 100094, Peoples R China
基金
中国国家自然科学基金;
关键词
analytic reliability solution; dependent competing failure processes; one-step parameter estimation; variation of degradation rate; Wiener degradation process; SYSTEMS SUBJECT; WEAR;
D O I
10.1002/qre.3216
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Most systems experience both random shocks (hard failure) and performance degradation (soft failure) during service span, and the dependence of the two competing failure processes has become a key issue. In this study, a novel dependent competing failure processes (DCFPs) model with a varying degradation rate is proposed. The comprehensive impact of random shocks, especially the effect of cumulative shock, is reasonably considered. Specifically, a shock will cause an abrupt degradation damage, and when the cumulative shock reaches a predefined threshold, the degradation rate will change. An analytical reliability solution is derived under the concept of first hitting time (FHT). Besides, a one-step maximum likelihood estimation method is established by constructing a comprehensive likelihood function. Finally, the reasonability of the closed form reliability solution and the feasibility and effectiveness of the proposed DCFPs modeling methodology are demonstrated by a comparative simulation study.
引用
收藏
页码:47 / 66
页数:20
相关论文
共 50 条
  • [31] Reliability modeling for systems subject to multiple dependent competing failure processes with shock loads above a certain level
    An, Zongwen
    Sun, Daoming
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2017, 157 : 129 - 138
  • [32] Reliability modeling for dependent competing failure processes based on planar mechanism
    Lyu, Hao
    Ma, Li
    Wang, Shuai
    Yang, Zaiyou
    Qu, Hongchen
    COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION, 2023, 53 (10) : 5059 - 5082
  • [33] Reliability modeling and a statistical inference method of accelerated degradation testing with multiple stresses and dependent competing failure processes
    Liu, Yao
    Wang, Yashun
    Fan, Zhengwei
    Bai, Guanghan
    Chen, Xun
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2021, 213
  • [34] Reliability assessment of degradation processes with random shocks considering recoverable shock damages
    Huang, Tingting
    Chen, Songming
    Zhao, Yuepu
    Dai, Wei
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART O-JOURNAL OF RISK AND RELIABILITY, 2023, 237 (06) : 1150 - 1162
  • [35] Reliability assessment and lifetime prediction of degradation processes considering recoverable shock damages
    Huang, Tingting
    Zhao, Yuepu
    Coit, David W.
    Tang, Loon-Ching
    IISE TRANSACTIONS, 2021, 53 (05) : 614 - 628
  • [36] Degradation under dynamic operating conditions: Modeling, competing processes and applications
    Hajiha, Mohammadmahdi
    Liu, Xiao
    Hong, Yili
    JOURNAL OF QUALITY TECHNOLOGY, 2021, 53 (04) : 347 - 368
  • [37] Reliability analysis of dependent competing failure processes with time-varying δ shock model
    Lyu, Hao
    Qu, Hongchen
    Yang, Zaiyou
    Ma, Li
    Lu, Bing
    Pecht, Michael
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2023, 229
  • [38] Reliability and maintenance modeling for systems subject to multiple dependent competing failure processes
    Peng, Hao
    Feng, Qianmei
    Coit, David W.
    IIE TRANSACTIONS, 2011, 43 (01) : 12 - 22
  • [39] Competing Failure Modeling for Systems under Classified Random Shocks and Degradation
    Liu, Jingyi
    Zhang, Kaichao
    Pang, Huan
    APPLIED SCIENCES-BASEL, 2023, 13 (13):
  • [40] Degradation modeling and remaining useful life prediction for dependent competing failure processes
    Yan, Tao
    Lei, Yaguo
    Li, Naipeng
    Wang, Biao
    Wang, Wenting
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2021, 212