Pyroelectric properties of dielectrics have been occupying the agenda of relevant scientific research groups owing to a number of device designs tailoring this effect, such as energy harvesting and caloric devices. Ferroelectrics come forward probably as the most important class of dielectrics in this regard due to their spontaneous polarization that is strongly dependent on temperature as well as strain and electric field. Here, we rigorously formulate and identify the connection between the experimentally accessible pyroelectric coefficient of a perovskite type ferroelectric and contributions arising from strain and clamping conditions. Secondary pyroelectric coefficient under partial clamping reminiscing a thin film is formulated so as to separate it from the primary coefficient that is conventionally defined at constant volume. The formulation is then applied to a number of ferroelectric compositions to reveal the extent of the variations in the secondary pyroelectric effect. The secondary effect reinforces the primary pyroelectric coefficient for the PMN-PT system, whereas it diminishes the total coefficient for PbZr0.4Ti0.6O3 and BaTiO3 systems. The role of thermal expansion coefficients in these variations is discussed.
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Department of Applied Physics, Hong Kong Polytechnic University, Hong Kong, Hong KongDepartment of Applied Physics, Hong Kong Polytechnic University, Hong Kong, Hong Kong
Zhou, Y.
Chan, H.K.
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School of Physics and Astronomy, University of Manchester, Manchester M13 9PL, United KingdomDepartment of Applied Physics, Hong Kong Polytechnic University, Hong Kong, Hong Kong
Chan, H.K.
Lam, C.H.
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Materials Research Centre, Centre for Smart Materials, Hong Kong Polytechnic University, Hong Kong, Hong KongDepartment of Applied Physics, Hong Kong Polytechnic University, Hong Kong, Hong Kong
Lam, C.H.
Shin, F.G.
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Materials Research Centre, Centre for Smart Materials, Hong Kong Polytechnic University, Hong Kong, Hong KongDepartment of Applied Physics, Hong Kong Polytechnic University, Hong Kong, Hong Kong
机构:
Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R ChinaHong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
Zhou, Y
Chan, HK
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
Chan, HK
Lam, CH
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
Lam, CH
Shin, FG
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机构:Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
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Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, NovosibirskInstitute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk
Pugachev A.M.
Sokolov A.A.
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Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, NovosibirskInstitute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk
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Univ Illinois, Dept Civil Mat & Environm Engn, Chicago, IL 60607 USA
Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
Lab Oxide Res & Educ, 842 W Taylor St, Chicago, IL 60607 USAUniv Illinois, Dept Civil Mat & Environm Engn, Chicago, IL 60607 USA
Adkins, J. W.
Fina, I.
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Inst Ciencia Mat Barcelona ICMAB CSIC, Campus UAB, Barcelona 08193, SpainUniv Illinois, Dept Civil Mat & Environm Engn, Chicago, IL 60607 USA
Fina, I.
Sanchez, F.
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Inst Ciencia Mat Barcelona ICMAB CSIC, Campus UAB, Barcelona 08193, SpainUniv Illinois, Dept Civil Mat & Environm Engn, Chicago, IL 60607 USA
Sanchez, F.
Bakaul, S. R.
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Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USAUniv Illinois, Dept Civil Mat & Environm Engn, Chicago, IL 60607 USA
Bakaul, S. R.
Abiade, J. T.
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Univ Illinois, Dept Civil Mat & Environm Engn, Chicago, IL 60607 USA
Lab Oxide Res & Educ, 842 W Taylor St, Chicago, IL 60607 USA
Univ Illinois, Dept Mech & Ind Engn, Chicago, IL 60607 USAUniv Illinois, Dept Civil Mat & Environm Engn, Chicago, IL 60607 USA