Suppression of Midinfrared Plasma Resonance Due to Quantum Confinement in δ-Doped Silicon

被引:0
|
作者
Young, Steve M. [1 ]
Katzenmeyer, Aaron M. [1 ]
Anderson, Evan M. [1 ]
Luk, Ting S. [1 ]
Ivie, Jeffrey A. [1 ]
Schmucker, Scott W. [1 ]
Gao, Xujiao [1 ]
Misra, Shashank [1 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
SPECTROSCOPIC ELLIPSOMETRY;
D O I
10.1103/PhysRevApplied.20.024043
中图分类号
O59 [应用物理学];
学科分类号
摘要
The classical Drude model provides an accurate description of the plasma resonance of threedimensional materials, but only partially explains two-dimensional systems where quantum mechanical effects dominate such as P:8 layers-atomically thin sheets of phosphorus dopants in silicon that induce electronic properties beyond traditional doping. Previously it was shown that P:8 layers produce a distinct Drude tail feature in ellipsometry measurements. However, the ellipsometric spectra could not be properly fit by modeling the 8 layer as a discrete layer of classical Drude metal. In particular, even for large broadening corresponding to extremely short relaxation times, a plasma resonance feature was anticipated but not evident in the experimental data. In this work, we develop a physically accurate description of this system, which reveals a general approach to designing thin films with intentionally suppressed plasma resonances. Our model takes into account the strong charge-density confinement and resulting quantum mechanical description of a P:8 layer. We show that the absence of a plasma resonance feature results from a combination of two factors: (i) the sharply varying charge-density profile due to strong confinement in the direction of growth; and (ii) the effective mass and relaxation time anisotropy due to valley degeneracy. The plasma resonance reappears when the atoms composing the 8 layer are allowed to diffuse out from the plane of the layer, destroying its well-confined two-dimensional character that is critical to its distinctive electronic properties.
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页数:11
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