One-Dimensional "Ghost Imaging" in Electron Microscopy of Inelastically Scattered Electrons

被引：2

作者：

Rotunno, Enzo ^{[1
]}

Gargiulo, Simone ^{[2
]}

Vanacore, Giovanni M. ^{[3
]}

Mechel, Chen ^{[4
]}

Tavabi, Amir H. ^{[5
,6
]}

Dunin-Borkowski, Rafal E. ^{[5
,6
]}

Carbone, Fabrizio ^{[2
]}

Madan, Ivan ^{[2
]}

Frabboni, Stefano ^{[7
]}

Guner, Tugrul ^{[8
]}

Karimi, Ebrahim ^{[8
]}

Kaminer, Ido ^{[4
]}

Grillo, Vincenzo ^{[1
]}

机构：

[1] Ist Nanosci CNR, Ctr S3, I-41125 Modena, Italy

[2] Ecole Polytech Fed Lausanne, Inst Phys, Lab Ultrafast Microscopy & Electron Scattering LUM, CH-1015 Lausanne, Switzerland

[3] Univ Milano Bicocca, Dept Mat Sci, I-20121 Milan, Italy

[4] Technion Israel Inst Technol, Dept Elect Engn, IL-32000 H_efa, Israel

[5] Ernst Ruska Ctr Microscopy & Spect Electrons, D-52425 Julich, Germany

[6] Peter Grunberg Inst, D-52425 Julich, Germany

[7] Univ Modena & Reggio Emilia, Dipartimento FIM, I-41125 Modena, Italy

[8] Univ Ottawa, Dept Phys, 25 Templeton St, Ottawa, ON K1N 6N5, Canada

来源：

ACS PHOTONICS | 2023年 / 10卷 / 06期

关键词：

electron-light entanglement; electron microscopy; electron beam shaping; electron-light interaction; ultrafast dynamics; DECOHERENCE; RESOLUTION;

D O I：

10.1021/acsphotonics.2c01925

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Entanglement and correlation are at the basis of quantummechanicsand have been used in optics to create a framework for "ghostimaging". We propose that a similar scheme can be used in anelectron microscope to exploit the correlation of electrons with thecoincident detection of collective mode excitations in a sample. Inthis way, an image of the sample can be formed on an electron cameraeven if electrons never illuminated the region of interest directly.This concept, which can be regarded as the inverse of photon-inducednear-field electron microscopy, can be used to probe delicate moleculeswith a resolution that is beyond the wavelength of the collectivemode.

引用

页码：1708 / 1715

页数：8

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