High-frequency Driving Circuit and Loss Analysis of SIC MOSFET Based on Discrete Components

被引:0
|
作者
Yue, Gai-Li [1 ]
Wang, Zi-Jing [1 ]
Xiang, Fu-Wei [1 ]
Xu, Zhen-Zhen [1 ]
机构
[1] Xian Univ Sci & Technol, Sch Elect & Control Engn, Xian, Peoples R China
基金
中国国家自然科学基金;
关键词
Silicon carbide metal oxide semiconductor transistor; Discrete components; High-frequency drive; Crosstalk; Low loss; RESONANT GATE DRIVER; CONVERTER; CROSSTALK;
D O I
10.1007/s42835-023-01752-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To reduce the loss of the high-frequency drive circuit of silicon carbide metal oxide semiconductor transistor (SiC MOSFET) and to better utilize the performance of the SiC MOSFET, a high-frequency drive circuit based on discrete components (DC-RGD) is proposed in this paper. The inductance is added to provide a low-impedance circuit for the gate charge/discharge circuit of the SiC MOSFET, enhancing the circuit's immunity to interference. At the same time, an auxiliary switching tube is added to form an active clamping circuit to reduce the impact of parasitic parameters on the drive waveform in high-frequency applications. A negative voltage is generated by adding a series capacitor to the drive circuit, ensuring the auxiliary switch is on during SiC MOSFET turn-off. This switch is not driven by an additional drive circuit, thus simplifying the circuit. The operation and losses of the circuit are analyzed, and the design methodology of the circuit is given. Finally, a Boost converter with an input of 24 V and an output of 48 V/5 A is constructed. The operating waveforms at a frequency of 0.5 MHz are tested, and the loss of the driving circuit is only 0.317 W. The results show that the proposed driving circuit ensures the reliability of the SiC MOSFETs and is able to solve the problem of the driving waveform oscillations efficiently, with a better anti-interference capability and lower loss.
引用
收藏
页码:2401 / 2411
页数:11
相关论文
共 50 条
  • [21] MOSFET-Based Memristor for High-Frequency Signal Processing
    Ghosh, Mourina
    Singh, Ankur
    Borah, Shekhar S.
    Vista, John
    Ranjan, Ashish
    Kumar, Santosh
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (05) : 2248 - 2255
  • [22] Parallel Resonant Loss Characterization of High-Frequency Magnetic Components
    Brown, Alyssa
    Solomentsev, Michael
    Hanson, Alex J.
    IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2024, 12 (06) : 5696 - 5704
  • [23] Experimental Validations of the SiC MOSFET based LLC Converter Circuit and Power Loss Models
    Wei, Yuqi
    Mantooth, Alan
    2021 IEEE 8TH WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS (WIPDA), 2021, : 322 - 327
  • [24] Influence of High-Frequency Operation on the Efficiency of a PMSM Drive with SiC-MOSFET Inverter
    Poolphaka, Paisak
    Jamshidpour, Ehsan
    Lubin, Thierry
    Baghli, Lotfi
    Takorabet, Noureddine
    ENERGIES, 2024, 17 (10)
  • [25] High-Frequency Drive Circuit and Its Loss Analysis of Cascode GaN High Electron Mobility Transistor
    Yue G.
    Xiang F.
    Li Z.
    Diangong Jishu Xuebao/Transactions of China Electrotechnical Society, 2021, 36 (20): : 4194 - 4203
  • [26] High-Frequency Characteristic Fluctuations of Nano-MOSFET Circuit Induced by Random Dopants
    Li, Yiming
    Hwang, Chih-Hong
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2008, 56 (12) : 2726 - 2733
  • [27] Ultra-fast MHz range driving circuit for SiC MOSFET using frequency multiplier with eGaN FET
    Kim, Taekyun
    Jang, Minsoo
    Agelidis, Vassilios G.
    IET POWER ELECTRONICS, 2016, 9 (10) : 2085 - 2094
  • [28] High-frequency characterization of embedded active components in printed circuit boards
    Cauwe, Maarten
    De Baets, Johan
    Van Calster, Andre
    EPTC 2006: 8TH ELECTRONIC PACKAGING TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2006, : 643 - 650
  • [29] HIGH-FREQUENCY LOSS
    BURSTEIN, H
    AUDIO, 1975, 59 (03): : 6 - 6
  • [30] A high temperature gate drive circuit for SiC MOSFET
    Qi, Feng
    Xu, Longya
    Wang, Jiangbo
    Zhao, Bo
    Zhou, Zhe
    Diangong Jishu Xuebao/Transactions of China Electrotechnical Society, 2015, 30 (23): : 24 - 31