Reducing Bonding Temperature and Energy Consumption in Electronic Packaging Using Flash Electro-Thermal Carbon Fiber Heating Elements

被引:2
|
作者
Park, Seong Yeon [1 ]
On, Seung Yoon [1 ]
Kim, Junmo [1 ]
Lee, Jeonyoon [2 ]
Kim, Taek-Soo [1 ]
Wardle, Brian L. [3 ,4 ]
Kim, Seong Su [1 ]
机构
[1] Korea Adv Inst Sci & Technol KAIST, Dept Mech Engn, Daejeon 305701, South Korea
[2] Korea Adv Inst Sci & Technol KAIST, Dept Aerosp Engn, Daejeon 305701, South Korea
[3] MIT, Dept Aeronaut & Astronaut, Cambridge, MA 02139 USA
[4] MIT, Dept Mech Engn, Cambridge, MA 02139 USA
基金
新加坡国家研究基金会;
关键词
semiconductor package; flash electro-thermal carbonfiber heating; bonding temperature; curvature; cure cycle; EPOXY MOLDING COMPOUND; CURING PROCESS; COMPOSITES;
D O I
10.1021/acsami.3c06145
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Semiconductor packaging based on an epoxy molding compound(EMC)currently has several disadvantages including warpage, limited processingarea, and variability that all negatively affect cost and productionyield. We propose a facile EMC molding process method using a flashelectro-thermal carbon fiber heating (FE-CH) device based on carbonfiber-based papers to manufacture an EMC molded to a copper substrate(EMC/Cu bi-layer package) via Joule heating, and using this device,a modified cure cycle that combines the conventional cure cycle (CCC)with rapid cooling was performed using FE-CH to reduce the curvatureof the EMC/Cu bi-layer package. Compared to the conventional hot pressprocess, which uses 3.17 MW of power, the FE-CH process only uses32.87 kW, resulting in a power consumption reduction of over 100 timeswhen following the CCC. Furthermore, the FE-CH-cured EMC/Cu bi-layerpackage exhibits mechanical properties equivalent to those of a hotpress-cured specimen, including the degree of cure, elastic modulus,curvature, bonding temperature, residual strain, and peel strength.The modified cure cycle using the FE-CH results in a 31% reductionin residual strain, a 32% reduction in curvature, and a 47% increasein peel strength compared to the CCC, indicating that this new processmethod is very promising for reducing a semiconductor package'sprice by reducing the process cost and warpage.
引用
收藏
页码:38750 / 38758
页数:9
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