Rapid Identification of Material Defects Based on Pulsed Multifrequency Eddy Current Testing and the k-Nearest Neighbor Method

被引:6
|
作者
Grochowalski, Jacek M. [1 ]
Chady, Tomasz [1 ]
机构
[1] West Pomeranian Univ Technol Szczecin, Fac Elect Engn, PL-70313 Szczecin, Poland
关键词
multifrequency excitation and spectrogram eddy current testing; nondestructive testing; k-Nearest Neighbors (k-NN) algorithm; eddy currents; finite element analysis; numerical simulations; INSPECTION;
D O I
10.3390/ma16206650
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The article discusses the utilization of Pulsed Multifrequency Excitation and Spectrogram Eddy Current Testing (PMFES-ECT) in conjunction with the supervised learning method for the purpose of estimating defect parameters in conductive materials. To obtain estimates for these parameters, a three-dimensional finite element method model was developed for the sensor and specimen containing defects. The outcomes obtained from the simulation were employed as training data for the k-Nearest Neighbors (k-NN) algorithm. Subsequently, the k-NN algorithm was employed to determine the defect parameters by leveraging the available measurement outcomes. The evaluation of classification accuracy for different combinations of predictors derived from measured data is also presented in this study.
引用
收藏
页数:23
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