Morphology and structure of CdCl2-Containing CdTe films deposited by discrete vacuum thermal evaporation

被引：8

作者：

Gevorgyan, V. A. ^{[1
]}

Mangasaryan, N. R. ^{[1
]}

Gremenok, V. F. ^{[2
]}

Tivanov, M. S. ^{[3
]}

Thakur, Preeti ^{[4
,5
]}

Thakur, Atul ^{[4
,5
]}

Trukhanov, S. V. ^{[2
]}

Zubar, T. I. ^{[2
]}

Sayyed, M. I. ^{[6
,7
]}

Tishkevich, D. I. ^{[2
]}

Trukhanov, A., V ^{[2
,8
]}

机构：

[1] Russian Armenian Slavonic Univ, Dept Mat Technol & Struct Elect Tech, Physico Engn Inst, Yerevan 0051, Armenia

[2] Sci Pract Mat Res Ctr NAS Belarus, Lab Magnet Film Phys, Minsk 220072, BELARUS

[3] Belarusian State Univ, Fac Phys, Nezavisimosti 4 Av, Minsk 220030, BELARUS

[4] Amity Univ Haryana, Ctr Nanotechnol, Gurugram 122413, Haryana, India

[5] Amity Univ Haryana, NanoLatticeX, Gurugram 122413, Haryana, India

[6] Isra Univ, Fac Sci, Dept Phys, Amman 1162, Jordan

[7] Imam Abdulrahman Bin Faisal Univ, Inst Res & Med Consultat IRMC, Dept Nucl Med Res, ZA-31441 Dammam, South Africa

[8] LN Gumilyov Eurasian Natl Univ, Nur Sultan 010000, Kazakhstan

来源：

VACUUM | 2023年 / 214卷

关键词：

Discrete vacuum thermal evaporation; Cadmium telluride (CdTe); CdCl2; treatment; Thin film; Solar cells; SOLAR-CELLS; SUBSTRATE-TEMPERATURE; THIN-FILMS; PHYSICAL-PROPERTIES; CADMIUM TELLURIDE; CDCL2; TREATMENT; PARAMETERS; EVOLUTION;

D O I：

10.1016/j.vacuum.2023.112248

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The impact of discrete vacuum thermal evaporation (DVTE)-produced CdTe thin films after thermal annealing and CdCl2 treatment is discussed in the present article. As a result of simultaneous DVTE of CdCl2 and CdTe, CdCl2 was added straightly into the bulk of the formed CdTe film at the 270 degrees C substrate temperature in a single procedure. The DVTE approach deposits CdTe thin films with a high crystalline structure, which can be utilized effectively for the production of high efficiency solar cell applications, according to the results of X-ray diffraction, scanning electron microscopy with focused ion beam, transmission electron microscopy, and atomic force microscopy measurements.

引用

页数：7

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