共 12 条
- [1] A TSV Repair Scheme Using Enhanced Test Access Architecture for 3-D ICs 2013 22ND ASIAN TEST SYMPOSIUM (ATS), 2013, : 7 - 12
- [2] Exploring the Feasibility of Using 3-D XPoint as an In-Memory Computing Accelerator IEEE JOURNAL ON EXPLORATORY SOLID-STATE COMPUTATIONAL DEVICES AND CIRCUITS, 2021, 7 (02): : 88 - 96
- [6] Energy-/Carbon-Aware Evaluation and Optimization of 3-D IC Architecture With Digital Compute-in-Memory Designs IEEE JOURNAL ON EXPLORATORY SOLID-STATE COMPUTATIONAL DEVICES AND CIRCUITS, 2024, 10 : 98 - 106