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Novel low loss dual-trench superjunction IGBT with semi-floating P-pillar
被引:3
|作者:
Shen, Zhigang
[1
]
Chen, Wensuo
[1
]
机构:
[1] Chongqing Univ, Sch Elect Engn, Natl Key Lab Power Transmiss Equipment Technol, Chongqing 400044, Peoples R China
关键词:
Superjunction insulated gate bipolar transistor;
(SJ-IGBT);
Semi-floating P-Pillar;
On-state voltage ( V CE(sat) );
Turn-off loss ( E off );
Breakdown voltage;
SIMULATION;
D O I:
10.1016/j.mejo.2023.106074
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
-In this paper, a novel dual-trench superjunction insulated gate bipolar transistor with semi-floating P-pillar (DTSFP-SJ-IGBT) is proposed and studied by simulation. The P-pillar of DTSFP-SJ-IGBT is semi-floating because only a portion is located below the trench gate, while a small part remains directly connected to the P-base. This small part P-pillar is depleted by the gate voltage in the on-state to enhance the carrier-storage effect, and provides an extraction hole path in the turning-off state to reduce the loss. The dual-trench structure results in a more uniform electric field distribution within the device while enhancing the carrier storage effect in the pillar regions. The simulation results show that at the same on-state voltage (V-CE(sat)) of 1.30 V, the turn-off loss (E-off) of the DTSFP-SJ-IGBT is 38.46 % lower than that of the superjunction IGBT with floating P-pillar (FP-SJ-IGBT), and 27.93 % lower than that of the recently reported superjunction IGBT with self-adaptive hole-extraction path (SAHE-SJ-IGBT). At the same E-off of 1.00 mJ/cm(2), the V-CE(sat) of the DTSFP-SJ-IGBT is 44.70 % lower than that of the conventional superjunction IGBT (Con-SJ-IGBT).
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页数:8
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