Optical and Structural Properties of Hg0.7Cd0.3Te Epitaxial Films

被引：0
|
作者：
Andryushchenko, D. A. [1 ]
Ruzhevich, M. S. [1 ]
Smirnov, A. M. [1 ]
Bazhenov, N. L. [2 ]
Mynbaev, K. D. [2 ]
Remesnik, V. G. [3 ]
机构：
[1] ITMO Univ, St Petersburg 197101, Russia
[2] Ioffe Inst, St Petersburg 194021, Russia
[3] Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia
来源：
SEMICONDUCTORS | 2023年 / 57卷 / 12期
关键词：
HgCdTe; defects; luminescence; X-ray diffraction; HGCDTE; PHOTOLUMINESCENCE; ALLOYS; MBE;
D O I：
10.1134/S1063782623090026
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The results of comparative studies of the optical and structural properties of Hg0.7Cd0.3Te bulk crystals and epitaxial films grown by various methods are presented. The data of photoluminescence studies performed in the temperature range 4.2-300 K showed the similarity of the optical properties of different samples and indicated a significant disordering of the solid solution. According to X-ray diffraction data, however, the scale of the disordering was not directly related to the structural quality of the material. The prospects for using the material grown by various methods in optoelectronics applications are discussed.
引用
收藏
页码：519 / 523
页数：5
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