Blade-Type Phase-Change Random Access Memory Technology, Challenge and Prospect

被引:1
|
作者
Xie, Weikun [1 ]
Wang, Lei [2 ]
Chen, Long [1 ]
Wang, Houjun [3 ]
机构
[1] 58th Res Inst China Elect Technol Grp Wuxi, Wuxi, Peoples R China
[2] Nanjing Univ Posts & Telecommun, Nanjing, Peoples R China
[3] Univ Elect Sci & Technol China, Sch Automat Engn, Chengdu, Peoples R China
来源
IEICE ELECTRONICS EXPRESS | 2023年 / 20卷 / 19期
基金
中国国家自然科学基金;
关键词
PCRAM; blade; storage; in-memory computing; density; energy;
D O I
10.1587/elex.20.20230307
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Blade-type phase-change random access memory (PCRAM) has recently become one promising candidate to compete with conventional PCRAM devices for next generation on-chip storage. This can be ascribed to its sharp contact region at heater-phase change layer interface, significantly lowering resulting energy consumption. However, a comprehensive review concerning the physical principles, current status, and possible improvements of blade-type PCRAM is still missing. To address this issue, here we first reviewed common phase-change materials for storage applications and physical principles of blade-type PCRAM. Subsequently, the current status of blade-type PCRAM from both experimental and theoretical perspectives was described as well as the performances comparison with conventional PCRAM. Possible approaches to overcome the technical challenges of blade-type PCRAM and its future prospect were eventually discussed.
引用
收藏
页码:1 / 6
页数:6
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