Ambient formation of high pressure Ag2Si2O5 and non-stoichiometric Ag0.3Al0.7 alloy under confinement

被引:0
|
作者
Pramanik, Subrata [1 ]
Mukhopadhyay, Mrinmay Kumar [2 ]
Biswas, Ripan Kumar [1 ,3 ]
Ghosh, Jiten [1 ]
Datta, Alokmay [4 ]
机构
[1] Cent Glass & Ceram Res Inst, CSIR, Mat Characterizat Div, 196 Raja SC Mullick Rd, Kolkata 700032, India
[2] Saha Inst Nucl Phys, Surface Phys & Mat Sci Div, 1-AF Bidhannagar, Kolkata 700032, India
[3] Res Inst Sustainable Energy RISE, TCG Ctr Res & Educ Sci & Technol TCG CREST, Sect 5, Kolkata 700091, India
[4] Univ Calcutta, Dept Phys, Kolkata, India
关键词
THIN-FILMS; LIQUID; XPS; PARAMETERS; SPECTRA;
D O I
10.1063/5.0161777
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report results of Field Emission Scanning Electron Microscopy (FESEM), Energy Dispersive Analysis of X-rays (EDAX), X-ray Photoelectron Spectroscopy (XPS), X-ray Reflectivity (XRR), and X-ray Diffraction (XRD) and residual stress measurement studies of Ag-silica composite films on Al(001) co-deposited from precursors and spin-coated at different frequencies under ambient conditions. FESEM and EDAX show Ag nanoparticle formation, and XRD, XPS, and XRR show Ag0.3Al0.7 alloy and Ag-rich silicate Ag2Si2O5 formation in all samples. The alloy is non-stoichiometric and non-equilibrium, while the silicate forms at high oxygen pressure. XRR shows the presence of three layers, nanoparticles on top, silicate in the middle, and alloy at the bottom, on an Ag-doped Al substrate. Film thickness decreases exponentially with frequency. Individual layers increase in crystal domain size with a frequency of 3000 rpm when the silicate layer thins below unit cell thickness and the growth has a two-dimensional preference. Our results suggest total confinement by film thinning and local confinement from the Ag nanolayer. Residual stress measurements on the films deposited at 500 and 5000 rpms show a gradual increase in the tensile stress. The increase in spinning frequency reveals the formation of high pressure ambience.
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页数:19
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