In-operando X-ray scattering characterization of smectite swelling experiments

被引:8
|
作者
Chaaya, R. [1 ,2 ]
Gaboreau, S. [1 ]
Milet, F. [2 ]
Maubec, N. [1 ]
Tremosa, J. [1 ]
Raimbourg, H. [2 ]
Ferrage, E. [3 ]
机构
[1] Bur Rech Geol & Minieres, F-45060 Orleans 2, France
[2] Observ Sci Univ ISTO, Campus Geosci,1A Rue Ferollerie, F-45071 Orleans, France
[3] Univ Poitiers, Equipe HydrASA, CNRS, IC2MP UMR 7285, 5 Rue Albert Turpain,Bat B8, F-86022 Poitiers, France
关键词
Smectite; Hydration; Swelling capacity; In-operando; X-ray scattering; Microstructure; NA-MONTMORILLONITE; LAYER CHARGE; HYDROMECHANICAL BEHAVIOR; INTERLAYER ORGANIZATION; HYDRATION PROPERTIES; POROSITY EVOLUTION; WATER-VAPOR; BENTONITE; DIFFRACTION; CLAY;
D O I
10.1016/j.clay.2023.107124
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Swelling capacity of smectite was studied over decades regarding its application as barrier in disposal of nuclear wastes in geological repositories as well as the induced volume change potential in soils according to moisture. In order to improve our knowledge in the swelling capacity of smectite, a miniaturized oedometer was developed to combine swelling pressure measurement with wide angle X-ray scattering (WAXS) characterization in real time during hydration of smectite. This coupled set up allowed studying hydration of smectite up to saturation under confined condions and linking crystalline swelling to pressure at various densities. The modeling of the WAXS patterns gave also quantitative information about the relative proportion of the different interlayer water types at saturation. In situ and operando data were acquired for homo-ionic Na+- and Ca2+-exchanged smectite at two different densities (1.5 and 1.8 g/cm3). The results showed that the swelling pressure rise was correlated to a sequence of water layer type with the transition from 0W to interstratification of 2W/3W layers, depending on the density. The cation valency controlled the rate of hydration with faster hydration in the case of divalent exchanged smectite. At saturation, with increasing density, the amount of 3W layers decreased to the gain of 1W and 0W layers. Results also confirmed that at saturation and a density of 1.8 g/cm3, the interlayer porosity represented the total one. Finally, this development provided opportunity to improve our knowledge in the swelling mechanism of compacted swelling clay materials upon hydration.
引用
收藏
页数:11
相关论文
共 50 条
  • [21] In-Situ/Operando X-ray Characterization of Metal Hydrides
    Liu, Yi-Sheng
    Jeong, Sohee
    White, James L.
    Feng, Xuefei
    Cho, Eun Seon
    Stavila, Vitalie
    Allendorf, Mark D.
    Urban, Jeffrey J.
    Guo, Jinghua
    CHEMPHYSCHEM, 2019, 20 (10) : 1261 - 1271
  • [22] Modular instrument mounting system for variable environment in operando X-ray experiments
    Folkman, C. M.
    Highland, M. J.
    Perret, E.
    Kim, S. K.
    Fister, T. T.
    Zhou, H.
    Baldo, P. M.
    Seifert, S.
    Eastman, J. A.
    Fuoss, P. H.
    Fong, D. D.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (02):
  • [23] ROSS FILTER DESIGN FOR X-RAY SCATTERING EXPERIMENTS
    GORDON, WL
    SOULES, JA
    PHYSICAL REVIEW, 1953, 90 (02): : 346 - 346
  • [24] In-Operando Anomalous Small-Angle X-Ray Scattering Investigation of Pt3Co Catalyst Degradation in Aqueous and Fuel Cell Environments
    Gilbert, James A.
    Kropf, A. Jeremy
    Kariuki, Nancy N.
    DeCrane, Stacy
    Wang, Xiaoping
    Rasouli, Somaye
    Yu, Kang
    Ferreira, Paulo J.
    Morgan, Dane
    Myers, Deborah J.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2015, 162 (14) : F1487 - F1497
  • [25] Functional materials analysis using in situ and in operando X-ray and neutron scattering
    Peterson, Vanessa K.
    Papadakis, Christine M.
    IUCRJ, 2015, 2 : 292 - 304
  • [26] Analysis of X-Ray and Gamma Ray Scattering Through Computational Experiments
    Feyzi Inanc
    Journal of Nondestructive Evaluation, 1999, 18 : 73 - 82
  • [27] In-situ/operando soft X-ray spectroscopy characterization of nanocatalysts
    Guo, Jinghua
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2013, 246
  • [28] Analysis of X-ray and gamma ray scattering through computational experiments
    Inanc, F
    JOURNAL OF NONDESTRUCTIVE EVALUATION, 1999, 18 (02) : 73 - 82
  • [29] Characterization of semiconductor materials by X-ray scattering
    Stömmer, R
    Nielen, H
    Iberl, A
    ANALYTICAL AND DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS, DEVICES, AND PROCESSES, 1999, 99 (16): : 117 - 133
  • [30] Characterization and comparison of X-ray focusing optics for ultrafast X-ray diffraction experiments
    Shymanovich, U.
    Nicoul, M.
    Sokolowski-Tinten, K.
    Tarasevitch, A.
    Michaelsen, C.
    von der Linde, D.
    APPLIED PHYSICS B-LASERS AND OPTICS, 2008, 92 (04): : 493 - 499