Abnormal Single-Lead Electrocardiograms Predict Future Atrial Fibrillation Risk: The VITAL-AF Trial

被引:0
|
作者
Pipilas, Daniel
Khurshid, Shaan
Al-Alusi, Mostafa
Atlas, Steven
Ashburner, Jeffrey M.
Borowsky, Leila H.
McManus, David D.
Singer, Daniel E.
Lubitz, Steven A.
Chang, Yuchiao
Ellinor, Patrick T.
机构
关键词
Atrial fibrillation; Electrocardiography; Device;
D O I
10.1161/circ.148.suppl_1.15268
中图分类号
R5 [内科学];
学科分类号
1002 ; 100201 ;
摘要
A15268
引用
收藏
页数:3
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