Growth of ultrathin Mn4N epitaxial films on SrTiO3(001) and their thickness-dependent magnetic structures

被引:1
|
作者
Yasuda, Tomohiro [1 ]
Amemiya, Kenta [2 ]
Suemasu, Takashi [3 ]
机构
[1] Univ Tsukuba, Grad Sch Sci & Technol, Degree Programs Pure & Appl Sci, Tsukuba, Ibaraki 3058573, Japan
[2] KEK, Inst Mat Struct Sci, Tsukuba, Ibaraki 3191106, Japan
[3] Univ Tsukuba, Inst Pure & Appl Sci, Dept Appl Phys, Tsukuba, Ibaraki 3058573, Japan
基金
日本学术振兴会;
关键词
RAY CIRCULAR-DICHROISM; MOMENT;
D O I
10.1063/5.0165783
中图分类号
O59 [应用物理学];
学科分类号
摘要
Mn4N thin films meet the requirements for efficient current-driven magnetic domain wall motion, such as perpendicular magnetic anisotropy and small magnetization. To demonstrate efficient field-free spin-orbit torque (SOT)-driven domain wall motion, the thickness of the Mn4N layer must be reduced. In this study, we focus on the fabrication of Mn4N ultrathin films on SrTiO3(001) substrates and demonstrate the epitaxial growth of Mn4N films as thin as around 4 nm. Surprisingly, the sign of the anomalous Hall resistivity of Mn4N reverses when the thickness of Mn4N decreases from approximately 8 to 4 nm. X-ray magnetic circular dichroism measurements suggest that the magnetic structure of Mn4N with a thickness of around 4 nm is different from that of conventional ferrimagnetic Mn4N films. The results obtained in this study are of great importance when considering the use of SOT and the interfacial Dzyaloshinskii-Moriya interaction in Mn4N ultrathin films.
引用
收藏
页数:7
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