P-i-N and Schottky P-i-N diamond diodes for high power limiters

被引:1
|
作者
Surdi, Harshad [1 ]
Bressler, Mason [2 ]
Ahmad, Mohammad Faizan [1 ]
Koeck, Franz [3 ]
Winters, Bryce [2 ]
Goodnick, Stephen [1 ]
Thornton, Trevor [1 ]
Nemanich, Robert J. [3 ]
Chang, Josephine [2 ]
机构
[1] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85281 USA
[2] Northrop Grumman Mission Syst, Linthicum, MD 21090 USA
[3] Arizona State Univ, Dept Phys, Tempe, AZ 85281 USA
关键词
D O I
10.1063/5.0176966
中图分类号
O59 [应用物理学];
学科分类号
摘要
P-i-N and Schottky P-i-N diamond diodes are a promising technology for high-power limiters. Receivers, solid-state amplifiers, and detectors commonly use P-i-N and/or Schottky diodes for protection from high power incident signals. Here, we report on the RF power handling and power dissipation capability of diamond P-i-N and Schottky P-i-N diodes. We fabricate P-i-N diodes as vertical structures, with both majority and minority carriers involved in charge transport. Similarly, we fabricate vertical Schottky P-i-N diodes, with the doping in the n-layer reduced compared to P-i-N diodes such that the n-layer becomes fully depleted during operation, resulting in a majority-carrier device with a fast recovery time. Both P-i-N and Schottky P-i-N diodes were packaged in shunt-configuration and matched for 3 GHz operation, with a small signal insertion loss of similar to 1.25 dB. P-i-N diodes operated up to 40 dBm before failing nondestructively at 45 dBm, demonstrating power dissipation handling that exceeds that of commercially available Si P-i-N diodes by more than a factor of five. Schottky P-i-N diodes operated up to 49 dBm before non-recoverable failure at 50 dBm.
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页数:5
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