Model-free characterization of topological edge and corner states in mechanical networks

被引:5
|
作者
Guzman, Marcelo [1 ,2 ]
Guo, Xiaofei [3 ]
Coulais, Corentin
Carpentier, David [1 ]
Bartolo, Denis [1 ]
机构
[1] Univ Claude Bernard, CNRS, Ecole Normale Super Lyon, Lab Phys, F-69342 Lyon, France
[2] Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA
[3] Univ Amsterdam, Inst Phys, NL-1098 XH Amsterdam, Netherlands
基金
欧洲研究理事会;
关键词
metamaterials; topological mechanics; topological phase;
D O I
10.1073/pnas.2305287121
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Topological materials can host edge and corner states that are protected from disorder and material imperfections. In particular, the topological edge states of mechanical structures present unmatched opportunities for achieving robust responses in wave guiding, sensing, computation, and filtering. However, determining whether a mechanical structure is topologically nontrivial and features topologically protected modes has hitherto relied on theoretical models. This strong requirement has limited the experimental and practical significance of topological mechanics to laboratory demonstrations. Here, we introduce and validate an experimental method to detect the topologically protected zero modes of mechanical structures without resorting to any modeling step. Our practical method is based on a simple electrostatic analogy: Topological zero modes are akin to electric charges. To detect them, we identify elementary mechanical molecules and measure their chiral polarization, a recently introduced marker of topology in chiral phases. Topological zero modes are then identified as singularities of the polarization field. Our method readily applies to any mechanical structure and effectively detects the edge and corner states of regular and higher -order topological insulators. Our findings extend the reach of chiral topological phases beyond designer materials and allow their direct experimental investigation.
引用
收藏
页数:12
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