Principle, Equipment and Applications of Line-Scanning Infrared Thermographic NDT

被引：0
|
作者：
Vavilov, V. P. [1 ]
Chulkov, A. O. [1 ]
Nesteruk, D. A. [1 ]
Kladov, D. Yu. [1 ]
机构：
[1] Natl Res Tomsk Polytech Univ, Engn Sch Nondestruct Testing, Lenin Ave 30, Tomsk 634050, Russia
来源：
JOURNAL OF NONDESTRUCTIVE EVALUATION | 2023年 / 42卷 / 04期
关键词：
Line Scan Thermography; Thermal nondestructive testing; Defect; Running contrast; Corrosion detection; CORROSION;
D O I：
10.1007/s10921-023-01001-4
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The Line Scan Thermography (LST) technique for thermal nondestructive testing (TNDT) uses continuous heating from an incandescent (quartz) linear tube heater. This provides a continuous linear inspection with a lower noise level than the classical single area Xenon flash TNDT technique. The basic theory of the LST technique is described, along with a description of a special, self-propelled LST device. It is shown that TNDT processes using a moving heat source can be evaluated by solving simpler, static TNDT problems using flash heating. An example of the experimental detection of hidden corrosion in steel is presented. The LST method is recommended for the continuous inspection of large objects, especially flat, cylindrical and/or conical shapes.
引用
收藏
页数：8
相关论文
共 50 条
  • [21] Non-destructive evaluation of metal and composite targets using an infrared line-scanning technique
    Smith, C
    Rowley, M
    Dvonch, C
    Fulton, M
    [J]. Thermosense XXVII, 2005, 5782 : 418 - 427
  • [22] Line-scanning quasi-confocal fluorescence imaging
    Yang B.
    Liu L.
    Liu Z.-Y.
    Ma S.-H.
    Chong X.-Y.
    He Y.-H.
    [J]. Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2010, 18 (05): : 1028 - 1034
  • [23] NDT APPLICATIONS OF SCANNING ACOUSTIC MICROSCOPY
    BURTON, NJ
    [J]. IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY, 1987, 134 (03): : 283 - 289
  • [24] Nodal line-scanning method for maskless optical lithography
    Johnson, Kenneth C.
    [J]. APPLIED OPTICS, 2014, 53 (34) : J7 - J18
  • [25] Pupil Engineering for a Confocal Reflectance Line-Scanning Microscope
    Patel, Yogesh G.
    Rajadhyaksha, Milind
    DiMarzio, Charles A.
    [J]. THREE-DIMENSIONAL AND MULTIDIMENSIONAL MICROSCOPY: IMAGE ACQUISITION AND PROCESSING XVIII, 2011, 7904
  • [26] Line-scanning Raman imaging spectroscopy for detection of fingerprints
    Deng, Sunan
    Liu, Le
    Liu, Zhiyi
    Shen, Zhiyuan
    Li, Guohua
    He, Yonghong
    [J]. APPLIED OPTICS, 2012, 51 (17) : 3701 - 3706
  • [27] Extended aperture line-scanning Hartmann wavefront sensor
    Xu, Hongfeng
    Wu, Jigang
    [J]. APPLIED OPTICS, 2021, 60 (12) : 3403 - 3411
  • [28] Photoluminescence Imaging Using Silicon Line-Scanning Cameras
    Mitchell, Bernhard
    Chung, Daniel
    Teal, Anthony
    [J]. IEEE JOURNAL OF PHOTOVOLTAICS, 2016, 6 (04): : 967 - 975
  • [29] Line-scanning confocal microendoscope for nuclear morphometry imaging
    Tang, Yubo
    Carns, Jennifer
    Richards-Kortum, Rebecca R.
    [J]. JOURNAL OF BIOMEDICAL OPTICS, 2017, 22 (11)
  • [30] THERMAL IMAGES GENERATED BY A LINE-SCANNING TECHNIQUE - STATISTICAL PROPERTIES
    BARBARIC, Z
    MARINCIC, A
    PETROVIC, G
    MILOVANOVIC, D
    [J]. APPLIED OPTICS, 1994, 33 (20) : 4416 - 4419
12345