Charge sharing in pixelated semiconductor sensors

被引：0
|
作者：
Kotov, I. V. [1 ]
Li, J. [1 ]
Pelliciari, J. [1 ]
Bisogni, V. [1 ]
机构：
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2023年 / 1046卷
关键词：
Diffusion equation; Charge distribution shape; DIFFUSION;
D O I：
10.1016/j.nima.2022.167718
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The charge sharing between neighboring pixels in pixelated sensors can be used to measure particle or x-ray coordinates with accuracy better than the pixel pitch. The accurate model of the charge distribution shape is essential to achieve ultimate coordinate accuracy. The charge sharing is caused by charge carriers diffusion on the path from the generation point to pixels. This paper is focused on the diffusion of the initially compact charge cloud in the field free region. The diffusion equation solutions are obtained using separation of variable and Fourier synthesis method for different initial conditions and resulting charge distributions are integrated over pixel areas. The look up table containing pre-calculated values for pixel charge fractions is proposed to speed up numerical calculations.
引用
收藏
页数：5
相关论文
共 50 条
  • [21] Using ambipolar sensitivity in pixelated semiconductor detectors
    Leak, C.
    Petryk, M.
    Hall, E.
    He, Z.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 1004
  • [22] The simulation of charge sharing in semiconductor X-ray pixel detectors
    Mathieson, K
    Bates, R
    O'Shea, V
    Passmore, MS
    Rahman, M
    Smith, KM
    Watt, J
    Whitehill, C
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 477 (1-3): : 191 - 197
  • [23] Depth Reconstruction Validation in Pixelated Semiconductor Detectors
    Kaye, Willy
    Berry, James
    Zhang, Feng
    He, Zhong
    2009 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-5, 2009, : 1768 - 1770
  • [24] Using ambipolar sensitivity in pixelated semiconductor detectors
    Leak, C.
    Petryk, M.
    Hall, E.
    He, Z.
    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2021, 1004
  • [25] A Statistical Model for Signal-Dependent Charge Sharing in Image Sensors
    Stefanov, Konstantin D.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (01) : 110 - 115
  • [26] Contacts Charge Transport and Additional Noise Properties of Semiconductor CdTe Sensors
    Sik, Ondrej
    Grmela, Lubomir
    Sikula, Josef
    2012 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID STATE CIRCUIT (EDSSC), 2012,
  • [27] Corrections for Fluorescence and Charge-Sharing Effects to Bremsstrahlung Spectra for a Hyperspectral Pixelated CZT X-Ray Detector
    Clark, Oakley
    Wilson, Matt
    Evans, Philip
    Harris, Emma
    Pani, Silvia
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2023, 70 (06) : 1202 - 1209
  • [28] Digital waveform analysis techniques for pixelated semiconductor detectors
    Anderson, Stephen E.
    Rodrigues, Miesher L.
    He, Zhong
    2007 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-11, 2007, : 1581 - 1586
  • [29] Compton Imaging Using Pixelated TlBr Semiconductor Detector
    Hitomi, Keitaro
    Matsumura, Motohiro
    Watanabe, Kenichi
    Maruyama, Shusuke
    Nogami, Mitsuhiro
    Akira, Uritani
    SENSORS AND MATERIALS, 2024, 36 (01) : 225 - 233
  • [30] Simulation of photon and charge transport in X-ray imaging semiconductor sensors
    Nilsson, HE
    Dubaric, E
    Hjelm, M
    Bertilsson, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 487 (1-2): : 151 - 162
12345