Probabilistic-Bits Based on Ferroelectric Field-Effect Transistors for Probabilistic Computing

被引:3
|
作者
Luo, Sheng [1 ]
He, Yihan [1 ]
Cai, Baofang [1 ]
Gong, Xiao [1 ]
Liang, Gengchiau [1 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117583, Singapore
关键词
FeFET; probabilistic-bit; probabilistic computing; dynamic model; multi-domain system;
D O I
10.1109/LED.2023.3285525
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A probabilistic bit (p-bit) is the fundamental building block in the circuit of probabilistic computing (PC), and it produces a random binary bitstream with tunable probability. Utilizing the randomness induced by thermal noise-induced lattice vibration in the ferroelectric (FE) material, we propose the p-bits based on stochastic ferroelectric FET (FeFET). The domain dynamic is revealed to play crucial roles in FE p-bits' stochasticity, as the domain coupling suppresses the dipole fluctuation. The proposed FE p-bits possess the advantages of both extremely low hardware cost and scalability for p-bit circuitry, rendering it a promising candidate for PC.
引用
收藏
页码:1356 / 1359
页数:4
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