HAXPES reference spectra of KI with Cr Kα excitation

被引：2
|
作者：
Zheng, Dong [1 ]
Young, Christopher N. [2 ]
Stickle, William F. [2 ]
机构：
[1] HP Singapore Private Ltd, Adv Mat & Test Ctr, 138 Depot Rd, Singapore 109683, Singapore
[2] HP Inc, Analyt & Dev Labs, Corvallis, OR 97330 USA
来源：
SURFACE SCIENCE SPECTRA | 2023年 / 30卷 / 02期
关键词：
HAXPES; Auger; KI; Cr K-alpha;
D O I：
10.1116/6.0003110
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Hard X-ray Photoelectron Spectroscopy (HAXPES) using monochromatic Cr K-alpha radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered potassium iodide (KI) sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
引用
收藏
页数：14
相关论文
共 50 条
  • [41] Non-LTE analysis of the formation of KI lines in the spectra of A-K stars
    Ivanova, DV
    Shimanskii, VV
    ASTRONOMY REPORTS, 2000, 44 (06) : 376 - 388
  • [42] DENSITY OF STATES IN K-EXCITATION SPECTRA OF SOLID AND LIQUID LITHIUM
    PETERSEN, H
    KUNZ, C
    JOURNAL OF PHYSICS F-METAL PHYSICS, 1977, 7 (12): : 2495 - 2502
  • [43] EMISSION AND EXCITATION-SPECTRA OF IF IN SOLID ARGON AT 12-K
    MILLER, JC
    ANDREWS, L
    JOURNAL OF MOLECULAR SPECTROSCOPY, 1980, 80 (01) : 178 - 184
  • [44] Condensation effects in K-shell excitation spectra of neon films
    Phys Rev B, 15 (9387):
  • [45] FLUORINE K-ALPHA RADIATION FOR EXCITATION OF ELECTRON-SPECTRA
    BERNDTSSON, A
    NYHOLM, R
    NILSSON, R
    HEDMAN, J
    NORDLING, C
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 13 (02) : 131 - 139
  • [46] Condensation effects in K-shell excitation spectra of neon films
    Wiethoff, P
    Ehrke, HU
    Kassuhlke, B
    Keller, C
    Wurth, W
    Menzel, D
    Feulner, P
    PHYSICAL REVIEW B, 1997, 55 (15): : 9387 - 9390
  • [47] Inelastic background analysis of HAXPES spectra: towards enhanced bulk sensitivity in photoemission
    Risterucci, Paul
    Renault, Olivier
    Martinez, Eugenie
    Detlefs, Blanka
    Zegenhagen, Jorg
    Grenet, Genevieve
    Tougaard, Sven
    SURFACE AND INTERFACE ANALYSIS, 2014, 46 (10-11) : 906 - 910
  • [48] Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample
    Zborowski, C.
    Renault, O.
    Torres, A.
    Yamashita, Y.
    Grenet, G.
    Tougaard, S.
    APPLIED SURFACE SCIENCE, 2018, 432 : 60 - 70
  • [49] Hyperfine spectra of KBr and KI
    Cederberg, James
    Randolph, J.
    McDonald, B.
    Paulson, B.
    McEachern, C.
    JOURNAL OF MOLECULAR SPECTROSCOPY, 2008, 250 (02) : 114 - 116
  • [50] Disorder effect on antiresonances in the excitation spectra of Cr3+-doped fluoride glasses
    Illarramendi, MA
    Fernández, J
    Balda, R
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2003, 326 : 184 - 188
12345