Research and analysis of voids in semiconductor laser diode packaging reflow soldering

The causes of voids in the soldering layer during vacuum reflow soldering of semiconductor laser devices are investigated, as are the movement and change laws of bubbles in the voids under different reflow chamber settings. An ultrasonic scanner is used to test and experiment with a series of 1064 nm wavelength semiconductor lasers. A technique for detecting the void rate based on the wavelength difference is proposed based on the association between the device wavelength, junction temperature, and voids. The average void rate error when comparing measured and calculated values is just 1.5%, demonstrating the validity of this estimation technique for defining the void rate of the device and providing a theoretical and practical reference to analyze the void rate of the device.