Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications

被引:0
|
作者
Niu, Yunfan [1 ]
Mo, Jiarui [1 ]
May, Alexander [2 ]
Rommel, Mathias [2 ]
Rossi, Chiara [2 ]
Romijn, Joost [1 ]
Zhang, Guoqi [1 ]
Vollebregt, Sten [1 ]
机构
[1] Delft Univ Technol, Dept Microelect, Delft, Netherlands
[2] Fraunhofer Inst Integrated Syst & Device Technol, Erlangen, Germany
来源
基金
欧盟地平线“2020”;
关键词
silicon carbide; analog-to-digital converter; harsh-enviromnent;
D O I
10.1109/SENSORS56945.2023.10325061
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
This work presents the design and characterization of an analog-to-digital converter (ADC) with silicon carbide (SiC) for sensing applications in harsh environments. The SiC-based ADC is implemented with the state-of-the-art low-voltage SiC complementary-metal-oxide-semiconductor (CMOS) technology developed by Fraunhofer IISB. Two types of ADCs, i.e., a 4-bit flash ADC and a 6-bit successive-approximation (SAR) ADC, are designed and simulated up to 300 degrees Celsius. The measurement results show that the 4-bit SiC flash ADC can operate reliably up to at least 200 degrees Celsius, which outperforms the Si counterpart regarding the maximum operating temperature.
引用
收藏
页数:4
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