All the right mooves: Keeping track of dairy cows with leading-edge sensor technology

被引：0
|
作者：
不详
机构：
来源：
NEW SCIENTIST | 2023年 / 246卷 / 3456期
关键词：
D O I：
暂无
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
收藏
页码：23 / 23
页数：1
相关论文
共 50 条
  • [31] Capillary electrophoresis for proteomics projects - Leading-edge technology or an also-ran?
    Wrotnowski, C
    GENETIC ENGINEERING NEWS, 2003, 23 (01): : 9 - +
  • [32] KCF-1 - USING THE LEADING-EDGE OF TECHNOLOGY IN A SMALL BROADCAST CAMERA
    REIMERS, U
    SMPTE JOURNAL, 1985, 94 (01): : 151 - 151
  • [33] IMAX-CORPORATION, OSCAR NOMINATED CANADIAN COMPANY ON THE LEADING-EDGE OF TECHNOLOGY
    SCHWARTZBERG, S
    PERFORMING ARTS & ENTERTAINMENT IN CANADA, 1993, 28 (01): : 42 - 45
  • [34] KCF-1 - USING THE LEADING-EDGE OF TECHNOLOGY IN A SMALL BROADCAST CAMERA
    REIMERS, UH
    ZAPPEN, WH
    ZETTL, HF
    SMPTE JOURNAL, 1985, 94 (05): : 573 - 577
  • [35] Push-button analysis aids study of leading-edge battery technology
    Sigmund, E
    CHEMTECH, 1999, 29 (11) : 13 - 16
  • [36] Manufacture of leading-edge, InP lasers using 50 millimeter processing technology
    Device and Technology Team, Alcatel Optronics, Nozay, France
    不详
    不详
    Alcatel Telecommun Rev, 2 nd Quarter (93-100):
  • [37] THE LEADING-EDGE .3. IN A SERIES OF REPORTS ON NEW TECHNOLOGY FROM XEROX
    LEWIS, RB
    DATAMATION, 1982, 28 (07): : 74 - 75
  • [38] Manufacture of leading-edge, InP lasers using 50 millimeter processing technology
    Simes, R
    Capella, RM
    Fernier, B
    Mayer, HP
    ALCATEL TELECOMMUNICATIONS REVIEW, 1996, (02): : 93 - 100
  • [39] A Leading-Edge 0.9μm Pixel CMOS Image Sensor Technology with Backside Illumination: Future Challenges for Pixel Scaling (Invited)
    Wuu, S. G.
    Wang, C. C.
    Hseih, B. C.
    Tu, Y. L.
    Tseng, C. H.
    Hsu, T. H.
    Hsiao, R. S.
    Takahashi, S.
    Lin, R. J.
    Tsai, C. S.
    Chao, Y. P.
    Chou, K. Y.
    Chou, P. S.
    Tu, H. Y.
    Hsueh, F. L.
    Tran, L.
    2010 INTERNATIONAL ELECTRON DEVICES MEETING - TECHNICAL DIGEST, 2010,
  • [40] Resistive Contrast Imaging, the Tool, Technique, and Applications on Leading-edge Semiconductor Technology Devices
    Ring, Rosalinda M.
    Newkirk, Randy
    Davidson, Kevin
    Capriola, James
    Russell, Dr. Jeremy
    Rummel, Andreas
    Carper, Edward C.
    ISTFA 2015: CONFERENCE PROCEEDINGS FROM THE 41ST INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2015, : 496 - 502
12345