Role of CdTe Interface Structure on CdS/CdTe Photovoltaic Device Performance

被引:1
|
作者
Jayswal, Niva K. [1 ]
Adhikari, Dipendra [1 ]
Subedi, Indra [1 ]
Shan, Ambalanath [1 ]
Podraza, Nikolas J. [1 ]
机构
[1] Univ Toledo, Wright Ctr Photovolta Innovat & Commercializat, Dept Phys & Astron, Toledo, OH 43606 USA
基金
美国国家科学基金会;
关键词
glancing angle deposition (GLAD); thin film solar cell; GLAD CdTe interlayer; interface tailoring; FILM SOLAR-CELLS; HIGH-EFFICIENCY; THIN-FILMS; STRESS; LAYER;
D O I
10.3390/ma16206812
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Glancing angle deposition (GLAD) of CdTe can produce a cubic, hexagonal, or mixed phase crystal structure depending upon the oblique deposition angles (phi) and substrate temperature. GLAD CdTe films are prepared at different phi at room temperature (RT) and a high temperature (HT) of 250 degrees C and used as interlayers between the n-type hexagonal CdS window layer and the p-type cubic CdTe absorber layer to investigate the role of interfacial tailoring at the CdS/CdTe heterojunction in photovoltaic (PV) device performance. The phi = 80 degrees RT GLAD CdTe interlayer and CdS both have the hexagonal structure, which reduces lattice mismatch at the CdS/CdTe interface and improves electronic quality at the heterojunction for device performance optimization. The device performance of HT CdS/CdTe solar cells with phi = 80 degrees RT with 50 to 350 nm thick GLAD CdTe interlayers is evaluated in which a 250 nm interlayer device shows the best device performance with a 0.53 V increase in open-circuit voltage and fill-factor product and a 0.73% increase in absolute efficiency compared to the HT baseline PV device without an interlayer.
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页数:12
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